Numéro |
J. Phys. Radium
Volume 17, Numéro 3, mars 1956
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|
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Page(s) | 184 - 189 | |
DOI | https://doi.org/10.1051/jphysrad:01956001703018400 |
J. Phys. Radium 17, 184-189 (1956)
DOI: 10.1051/jphysrad:01956001703018400
Laboratoire de Physique générale de la Faculté des sciences de Marseille
6855 - Thin film structure and morphology.
Key words
films -- light reflection -- refractive index -- light transmission
DOI: 10.1051/jphysrad:01956001703018400
Étude de la structure des couches minces par des procédés optiques
P. RouardLaboratoire de Physique générale de la Faculté des sciences de Marseille
Abstract
Purely optical methods gave the possibility to show that evaporated thin films have a granular structure, generally present a transition layer on both support and air side, and a gradient of index. These results explain why polarimetric methods carried out to determinate simultanously optical constants and the thickness of thin films have not always given the results we could wait from them.
6855 - Thin film structure and morphology.
Key words
films -- light reflection -- refractive index -- light transmission