Numéro
J. Phys. Radium
Volume 17, Numéro 3, mars 1956
Page(s) 184 - 189
DOI https://doi.org/10.1051/jphysrad:01956001703018400
J. Phys. Radium 17, 184-189 (1956)
DOI: 10.1051/jphysrad:01956001703018400

Étude de la structure des couches minces par des procédés optiques

P. Rouard

Laboratoire de Physique générale de la Faculté des sciences de Marseille


Abstract
Purely optical methods gave the possibility to show that evaporated thin films have a granular structure, generally present a transition layer on both support and air side, and a gradient of index. These results explain why polarimetric methods carried out to determinate simultanously optical constants and the thickness of thin films have not always given the results we could wait from them.

PACS
6855 - Thin film structure and morphology.

Key words
films -- light reflection -- refractive index -- light transmission