Numéro |
J. Phys. Radium
Volume 17, Numéro 3, mars 1956
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Page(s) | 224 - 229 | |
DOI | https://doi.org/10.1051/jphysrad:01956001703022400 |
J. Phys. Radium 17, 224-229 (1956)
DOI: 10.1051/jphysrad:01956001703022400
Laboratoire de Physique E. P. U. L., Université de Lausanne
6855 - Thin film structure and morphology.
Key words
films -- fluctuations -- indium -- metal theory -- silver
DOI: 10.1051/jphysrad:01956001703022400
Effet de scintillation et structure de couches minces métalliques
J.P. BorelLaboratoire de Physique E. P. U. L., Université de Lausanne
Abstract
Study of the scintillation effect of thin layers of Ag and In for frequencies between 16 Hz and 100 kHz. For small currents, à law is found in the form of : e = k I2/v. For very thin layers, which are not continuous, this law does not hold if Ic is greater than a certain limit. The discrepancy is particularly noticeable at low frequencies. Scintillation effect of layers of various thicknesses is studied in relation with their structure (observed by electronic microscope).
6855 - Thin film structure and morphology.
Key words
films -- fluctuations -- indium -- metal theory -- silver