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Article cité :
M. Fabre de la Ripelle
J. Phys. Radium, 10 11 (1949) 319-329
Citations de cet article :
17 articles
Cross Sections for Inner-Shell Ionization by Electron Impact
Xavier Llovet, Cedric J. Powell, Francesc Salvat and Aleksander Jablonski43 (1) (2014)https://doi.org/10.1063/1.4832851
The quantitative analysis of thin specimens: a review of progress from the Cliff‐Lorimer to the new ζ‐factor methods
M. WATANABE and D. B. WILLIAMS221 (2) 89 (2006)https://doi.org/10.1111/j.1365-2818.2006.01549.x
An empirical expression for K-shell ionization cross section by electron impact
C Hombourger31 (16) 3693 (1998)https://doi.org/10.1088/0953-4075/31/16/020
Modern Developments and Applications in Microbeam Analysis
Xavier Llovet, Claude Merlet and Francesc Francesc Salvathttps://doi.org/10.1007/978-3-7091-7506-4_21
X-Ray Spectrometry in Electron Beam Instruments
D. E. Newburyhttps://doi.org/10.1007/978-1-4615-1825-9_11
Auger electron spectroscopy
Ch. Linsmeier45 (6-7) 673 (1994)https://doi.org/10.1016/0042-207X(94)90108-2
A comparison of Monte Carlo simulations of electron scattering and X-ray production in solids
Ding Ze-Jun and Wu Ziqin26 (4) 507 (1993)https://doi.org/10.1088/0022-3727/26/4/001
Thin film standardless analysis used in TEM asbestos EDS analysis
X. Li, J. Xingxing, W. Zi-qin, et al. 46 966 (1988)https://doi.org/10.1017/S0424820100106892
Standardless EDS analysis of bulk and thin specimens
Ziqin Wu7 (4) 323 (1987)https://doi.org/10.1002/jemt.1060070412
Electron Impact Ionization
S. M. Younger and T. D. Märkhttps://doi.org/10.1007/978-3-7091-4028-4_2
An empirical approach to K-shell ionisation cross section by electrons
E Casnati, A Tartari and C Baraldi15 (1) 155 (1982)https://doi.org/10.1088/0022-3700/15/1/022
Mass Spectrometric Determination of Partial Ionization Cross Sections
T. D. Märk22 (3) 257 (1982)https://doi.org/10.1002/ctpp.19820220306
Theory of the Ionization of Atoms by Electron Impact
M. R. H. RUDGE40 (3) 564 (1968)https://doi.org/10.1103/RevModPhys.40.564
Bilan énergétique d'une décharge réflex
R. Basile and J.M. Lagrange31 (2) 195 (1964)https://doi.org/10.1016/0029-554X(64)90158-2
Schlieren photography of an orthogonal pinch
U. Ascoli-Bartoli and S. Martellucci27 (2) 475 (1963)https://doi.org/10.1007/BF02785556
Wavelength dependence of the refractive index of a plasma in the optical region
U. Ascoli-Bartoli, A. De Angelis and S. Martellucci18 (6) 1116 (1960)https://doi.org/10.1007/BF02733170
Ergebnisse der Exakten Naturwissenschaften
H. Neuert29 1 (1956)https://doi.org/10.1007/BFb0118836
