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Article cité :
Raymond Castaing , Jacques Descamps
J. Phys. Radium, 16 4 (1955) 304-317
Citations de cet article :
236 articles | Pages :
A New Theory for Microprobe Analysis
R. H. Packwood and J. D. Brown22 (2) 211 (1983)https://doi.org/10.1179/cmq.1983.22.2.211
A correction procedure for characteristic fluorescence encountered in microprobe analysis near phase boundaries
G. F. Bastln, F. J. J. van Loo, P. J. C. Vosters and J. W. G. A. Vrolljk5 (4) 172 (1983)https://doi.org/10.1002/sca.4950050402
A measurement of the reduction of the range of fast electrons from laser irradiated targets due to density structure in low density gold substrates
D J Bond, J D Hares and J D Kilkenny24 (1) 91 (1982)https://doi.org/10.1088/0032-1028/24/1/008
Interaction electron-matière: Application à la mesure de l'épaisseur d'une lame mince solide
Claude Landron11-12 100 (1982)https://doi.org/10.1016/0378-5963(82)90056-3
X-ray depth distribution (φ (ϱz)) curves for x-ray microanalysis of frozen-hydrated bulk biological samples
A.T. Marshall13 (3) 317 (1982)https://doi.org/10.1016/0047-7206(82)90037-1
Development of a film microanalysis method
Claude Landron94 (1) 23 (1982)https://doi.org/10.1016/0040-6090(82)90026-8
Interactions d'électrons avec des cibles amorphes ou polycristallines: Emission × caractéristique
C. Landron67 (2) 717 (1981)https://doi.org/10.1002/pssa.2210670244
Updating correction procedures in quantitative electron‐probe microanalysis
G. Love and V. D. Scott4 (3) 111 (1981)https://doi.org/10.1002/sca.4950040302
Diffraction methods analysis of the approximation of the real glass structure
Zenon Bochyński46 (3) 405 (1981)https://doi.org/10.1016/0022-3093(81)90016-8
Untersuchungen zur Ermittlung der Tiefenverteilung der primären Ionisationen in dicken Zwei-Element-Targets bei Beschuß mit Elektronen aus dem Energiebereich unterhalb 30 keV. Teil 1
M. Gaber and P. Jugelt17 (8-9) 336 (1981)https://doi.org/10.1080/10256018108544633
A Gaussian expression to describe ϕ(ρz) curves for quantitative electron probe microanalysis
R. H. Packwood and J. D. Brown10 (3) 138 (1981)https://doi.org/10.1002/xrs.1300100311
Trace detection in surface microanalysis
C Landron31 (7) 291 (1981)https://doi.org/10.1016/S0042-207X(81)80499-X
Self-absorption studies of the soft X-ray emission and absorption edges of K, Mg, Al and Be
R S Crisp10 (3) 511 (1980)https://doi.org/10.1088/0305-4608/10/3/021
Messungen zum lateralen Aufl�sungsverm�gen f�r R�ntgenquanten bei der Elektronenstrahl-Mikroanalyse
Werner Weisweiler, Renate Neff and Klaus Zetzmann73 (5-6) 361 (1980)https://doi.org/10.1007/BF01196323
Berechnung der Tiefenvereilung der primären Ionisationen in dicken Ein-Element-Targets bei Beschuß mti Elektronen aus den Energiebereich unterhalb 30 keV
M. Gaber* and P. Jugelt16 (6) 185 (1980)https://doi.org/10.1080/10256018008544448
Internal and surface layer structural analysis of silicate glasses
Zenon Bochynski38-39 135 (1980)https://doi.org/10.1016/0022-3093(80)90407-X
Surface and Colloid Science
Gudrun A. Hutchinshttps://doi.org/10.1007/978-1-4615-7969-4_6
Handbuch Festkörperanalyse mit Elektronen, Ionen und Röntgenstrahlen
W. Beier, A. Röder and O. Brümmerhttps://doi.org/10.1007/978-3-322-83622-9_5
An empirical calculation of the depth distribution of primary X-ray production
V Lantto12 (7) 1181 (1979)https://doi.org/10.1088/0022-3727/12/7/022
The atomic number and absorption corrections in electron microprobe analysis at low electron energies
L. Parobek and J. D. Brown7 (1) 26 (1978)https://doi.org/10.1002/xrs.1300070109
The surface ionisation function ϕ(0) derived using a Monte Carlo method. (Correction procedure development for electron-probe microanalysis)
G Love, M G Cox and V D Scott11 (1) 23 (1978)https://doi.org/10.1088/0022-3727/11/1/005
Method for measuring the absorption correction f(χ) with an energy dispersive x‐ray detector
B. Neumann and L. Reimer1 (4) 243 (1978)https://doi.org/10.1002/sca.4950010405
A simple Monte Carlo method for simulating electron-solid interactions and its application to electron probe microanalysis
G Love, M G C Cox and V D Scott10 (1) 7 (1977)https://doi.org/10.1088/0022-3727/10/1/002
Raster-Elektronenmikroskopie
Ludwig Reimer and Gerhard Pfefferkornhttps://doi.org/10.1007/978-3-642-81112-8_6
Electron Microscopy in Mineralogy
R. Könighttps://doi.org/10.1007/978-3-642-66196-9_40
X‐ray production as a function of depth for low electron energies
J. D. Brown and L. Parobek5 (1) 36 (1976)https://doi.org/10.1002/xrs.1300050109
Einflu� der elektrischen Leitf�higkeit der Probe auf die Korrekturberechnung bei der quantitativen Mikrosondenanalyse
Achim R. B�chner and Johannes P. M. Stienen66 (5-6) 635 (1976)https://doi.org/10.1007/BF01220124
On the detectability of impurity atoms in a thin surface layer by an electron microprobe analyser
T. Warminski34 (2) K119 (1976)https://doi.org/10.1002/pssa.2210340251
8 (13) 1542 (1975)https://doi.org/10.1088/0022-3727/8/13/016
Characteristic X-ray excitation in thin films by 4–50 keV electron bombardment
Wolfgang O. Hofer29 (2) 223 (1975)https://doi.org/10.1016/0040-6090(75)90192-3
Microanalyse et microscopie photoélectroniques X: principe et performances prévisibles
J. Cazaux10 (5) 263 (1975)https://doi.org/10.1051/rphysap:01975001005026300
Absorption of primary x-rays in electron probe microanalysis
Kurt F. J. Heinrich and Harvey. Yakowitz47 (14) 2408 (1975)https://doi.org/10.1021/ac60364a018
Siebentes Kolloquium über metallkundliche Analyse mit besonderer Berücksichtigung der Elektronenstrahl-Mikroanalyse
A. R. Büchner and J. P. M. Stienen6 227 (1975)https://doi.org/10.1007/978-3-7091-8422-6_18
Microprobe technique for determining the thickness of thin metal films in multilayered structures
G. Digiacomo26 (2) 311 (1975)https://doi.org/10.1016/0040-6090(75)90145-5
A quantitative analysis of very light elements by the electron probe microanalyser
J Ruste and M Gantois8 (7) 872 (1975)https://doi.org/10.1088/0022-3727/8/7/020
Practical Scanning Electron Microscopy
R. B. Bolon, E. Lifshin and M. F. Ciccarellihttps://doi.org/10.1007/978-1-4613-4422-3_8
Assessment of Philibert's absorption correction models in electron-probe microanalysis
G Love, M G C Cox and V D Scott8 (14) 1686 (1975)https://doi.org/10.1088/0022-3727/8/14/012
Elektronenstrahl-Mikroanalyse von Kohlenstoffen
Werner Weisweiler63 (4) 365 (1975)https://doi.org/10.1007/BF01217665
Advances in X-Ray Analysis
L. Parobek and J. D. Brownhttps://doi.org/10.1007/978-1-4613-9975-9_39
Temperature dependence of cathodoluminescence in n-type gallium arsenide
G A C Jones, B R Nag and A Gopinath7 (1) 183 (1974)https://doi.org/10.1088/0022-3727/7/1/326
Elektronenstrahl‐Mikroanalytik elektrisch nichtleitender Proben leichter Elemente am Beispiel von Oxiden
Werner Weisweiler45 (5) 287 (1974)https://doi.org/10.1002/srin.197404560
Characterization of Solid Surfaces
Gudrun A. Hutchinshttps://doi.org/10.1007/978-1-4613-4490-2_19
Electron probe microanalysis using oxygen x-rays: II. Absorption correction models
G Love, M G C Cox and V D Scott7 (15) 2142 (1974)https://doi.org/10.1088/0022-3727/7/15/319
Raster-Elektronenmikroskopie
Ludwig Reimer and Gerhard Pfefferkornhttps://doi.org/10.1007/978-3-662-00083-0_6
Advances in X-Ray Analysis
J. D. Brown and L. Parobekhttps://doi.org/10.1007/978-1-4613-9972-8_19
Diffusion profile measurements in the base of a microwave transistor
R.L. Kronquist, J.P. Soula and M.E. Brilman16 (10) 1159 (1973)https://doi.org/10.1016/0038-1101(73)90143-3
Microscope photoélectronique pour l'analyse chimique des surfaces
J. Cazaux8 (4) 371 (1973)https://doi.org/10.1051/rphysap:0197300804037100
An Experimental Evaluation of the Atomic Number Effect
L. Parobek and J. D. Brown17 479 (1973)https://doi.org/10.1154/S0376030800005528
Advances in Geophysics Volume 16
D.G.W. Smith and J.C. Rucklidge16 57 (1973)https://doi.org/10.1016/S0065-2687(08)60351-9
Investigation of Electron Penetration and X‐Ray Production in Solid Targets
T. Matsukawa, K. Murata and R. Shimizu55 (1) 371 (1973)https://doi.org/10.1002/pssb.2220550139
Elektronenstrahl-Mikroanalyse von Kohlenstoffen
Werner Weisweiler60 (2) 145 (1972)https://doi.org/10.1007/BF01218326
Absorption Correction Curves Obtained from Measurements of the Production of X-Rays as a Function of Depth
J.D. Brown and L. Parobek16 198 (1972)https://doi.org/10.1154/S0376030800004031
https://doi.org/10.1520/STP37403S
The present state of quantitative electron probe microanalysis
S.J.B reed2 (2) 92 (1971)https://doi.org/10.1088/0034-6683/2/2/I02
Electron Beam Modulated Optical Properties of Semiconductors
John H. McCoy and D. B. Wittry42 (3) 1174 (1971)https://doi.org/10.1063/1.1660163
Electron probe microanalysis
Wilhad Reuter25 (1) 80 (1971)https://doi.org/10.1016/0039-6028(71)90211-1
Materialprüfung mit Röntgenstrahlen
Richard Glockerhttps://doi.org/10.1007/978-3-642-87421-5_6
Fünftes Kolloquium über metallkundliche Analyse mit besonderer Berücksichtigung der Elektronenstrahl-Mikroanalyse
Christian Thoma4 102 (1970)https://doi.org/10.1007/978-3-7091-4529-6_11
Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / Ve Congrès International sur l’Optique des Rayons X et la Microanalyse
U. Schmitz, P. L. Ryder and W. Pitschhttps://doi.org/10.1007/978-3-662-12108-5_16
Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / Ve Congrès International sur l’Optique des Rayons X et la Microanalyse
U. Schmitz, P. L. Ryder and W. Pitschhttps://doi.org/10.1007/978-3-662-24778-5_16
Electron Probe Microanalysis
GUNJI SHINODAhttps://doi.org/10.1016/B978-0-12-014566-9.50007-5
Strengthening of Class Fibers: 11, Ion Exchange *
A. R. COOPER and D. A. KROHN52 (12) 665 (1969)https://doi.org/10.1111/j.1151-2916.1969.tb16073.x
Electron Probe Microanalysis
RICHARD C. WOLF and VICTOR G. MACREShttps://doi.org/10.1016/B978-0-12-014566-9.50009-9
Electron Probe Microanalysis
JAMES D. BROWNhttps://doi.org/10.1016/B978-0-12-014566-9.50008-7
Physical Measurement and Analysis of Thin Films
James E. Clinehttps://doi.org/10.1007/978-1-4899-5910-2_3
https://doi.org/10.1520/STP41828S
Advances in Agronomy
Michel P. Cescas, Edward H. Tyner and Lawrence J. Gray20 153 (1968)https://doi.org/10.1016/S0065-2113(08)60856-1
X-Ray and Electron Methods of Analysis
Robert E. Ogilviehttps://doi.org/10.1007/978-1-4899-5913-3_3
Measurements of K, L and M shell X-ray production efficiencies
M Green and V E Cosslett1 (4) 425 (1968)https://doi.org/10.1088/0022-3727/1/4/303
Distribution in depth of the primary X-ray emission in anticathodes of titanium and lead
A Vignes and G Dez1 (10) 1309 (1968)https://doi.org/10.1088/0022-3727/1/10/311
The metallurgy of meteorites
H.J. Axon13 183 (1968)https://doi.org/10.1016/0079-6425(68)90021-2
The absorption and atomic number corrections in electron-probe X-ray microanalysis
H E Bishop1 (6) 673 (1968)https://doi.org/10.1088/0022-3727/1/6/301
X-ray absorption and emission
William Joseph. Campbell and James Douglas. Brown40 (5) 346 (1968)https://doi.org/10.1021/ac60261a028
Advances in X-ray Analysis
Kurt F. J. Heinrichhttps://doi.org/10.1007/978-1-4684-8676-6_3
Electron Probe Microanalysis: A Review
Kurt F. J. Heinrich22 (5) 395 (1968)https://doi.org/10.1366/000370268774384605
https://doi.org/10.1520/STP41827S
Evalulation of correction procedures used in electron probe microanalysis with emphasis on atomic number interval 13 to 33
Donald R. Beaman39 (4) 418 (1967)https://doi.org/10.1021/ac60248a023
Methods of Biochemical Analysis
C. A. Andersen15 147 (1967)https://doi.org/10.1002/9780470110331.ch4
Measurement of Diffusion Lengths in Direct-Gap Semiconductors by Electron-Beam Excitation
David B. Wittry and David F. Kyser38 (1) 375 (1967)https://doi.org/10.1063/1.1708984
Der Elektronenstrahl‐Mikroanalysator, ein analytisches Hilfsmittel für den Chemiker
Ir. M. Klerk and E. Roeder39 (9-10) 567 (1967)https://doi.org/10.1002/cite.330390913
Common Sources of Error in Electron Probe Microanalysis
Kurt F. J. Heinrich11 40 (1967)https://doi.org/10.1154/S0376030800004730
The Role of Grain Boundaries and Surfaces in Ceramics
T. J. Gray and J. K. Zopehttps://doi.org/10.1007/978-1-4899-6311-6_19
Film thickness determination by electron probe microanalysis
D.P. Whittle and G.C. Wood6 (9) 397 (1966)https://doi.org/10.1016/0010-938X(66)80013-6
Elektronenstrahl-Mikroanalyse
Hanns Malissahttps://doi.org/10.1007/978-3-7091-7937-6_4
An Electron Transport Model for the Prediction of X-Ray Production and Electron Backscattering in Electron Microanalysis
D. B. Brown and R. E. Ogilvie37 (12) 4429 (1966)https://doi.org/10.1063/1.1708054
A Monte Carlo calculation on the scattering of electrons in copper
H E Bishop85 (5) 855 (1965)https://doi.org/10.1088/0370-1328/85/5/305
The identification of precipitates in maraging steels by electron microscopy and electron probe X-ray microanalysis
M J Fleetwood, G M Higginson and G P Miller16 (5) 645 (1965)https://doi.org/10.1088/0508-3443/16/5/307
Multiple scattering of 5 - 30 keV electrons in evaporated metal films III: Backscattering and absorption
V E Cosslett and R N Thomas16 (6) 779 (1965)https://doi.org/10.1088/0508-3443/16/6/303
The angular distribution of characteristic x radiation and its origin within a solid target
M Green83 (3) 435 (1964)https://doi.org/10.1088/0370-1328/83/3/311
Advances in X-Ray Analysis
David B. Wittryhttps://doi.org/10.1007/978-1-4684-8637-7_34
An Evaluation of the Archard Electron Diffusion Model
D. B. Brown and R. E. Ogilvie35 (10) 2793 (1964)https://doi.org/10.1063/1.1713107
Advances in X-Ray Analysis
James D. Brownhttps://doi.org/10.1007/978-1-4684-8637-7_30
On the mechanism of oxidation of iron-16·4% chromium at high temperature
G.C. Wood and D.P. Whittle4 (1-4) 263 (1964)https://doi.org/10.1016/0010-938X(64)90026-5
https://doi.org/10.1520/STP45951S
Limitations of the Linear Intensity-Concentration Approximation in Electron Probe Microanalysis
James D. Brown7 340 (1963)https://doi.org/10.1154/S0376030800002652
X-ray Optics and X-ray Microanalysis
R. CASTAINGhttps://doi.org/10.1016/B978-1-4832-3322-2.50032-9
X-ray Optics and X-ray Microanalysis
J. PHILIBERThttps://doi.org/10.1016/B978-1-4832-3322-2.50039-1
Quantitative Analysis with the Electron Microanalyzer.
T. O. Ziebold and R. E. Ogilvie35 (6) 621 (1963)https://doi.org/10.1021/ac60199a038
X-ray Optics and X-ray Microanalysis
GUNJI SHINODAhttps://doi.org/10.1016/B978-1-4832-3322-2.50034-2
X-ray Optics and X-ray Microanalysis
R. SHIMIZU and G. SHINODAhttps://doi.org/10.1016/B978-1-4832-3322-2.50042-1
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