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On the physical basis of localized [ponctuelle] analysis by X-ray spectrography.
Sur les bases physiques de l'analyse ponctuelle par spectrographie X

Raymond Castaing, Jacques Descamps

J. Phys. Radium, 16 4 (1955) 304-317

DOI: https://doi.org/10.1051/jphysrad:01955001604030400

Citations de cet article :

Electron microanalysis of metallic meteorites

Joseph I. Goldstein and Robert E. Ogilvie
Geochimica et Cosmochimica Acta 27 (6) 623 (1963)
https://doi.org/10.1016/0016-7037(63)90015-2

Coating thickness measurement by electron probe microanalysis

G H Cockett and C D Davis
British Journal of Applied Physics 14 (11) 813 (1963)
https://doi.org/10.1088/0508-3443/14/11/320

Methods of Quantitative Electron Probe Analysis*

David B. Wittry
Advances in X-ray Analysis 7 395 (1963)
https://doi.org/10.1154/S037603080000269X

K X-ray yields from elements of low atomic number

Proceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences 274 (1358) 319 (1963)
https://doi.org/10.1098/rspa.1963.0135

Scanning Single-Crystal Multichannel X-Ray Spectrometer

N. Spielberg and J. Ladell
Review of Scientific Instruments 34 (11) 1208 (1963)
https://doi.org/10.1063/1.1718178

The present state of quantitative X-ray microanalysis Part 2: Computational methods

G D Archard and T Mulvey
British Journal of Applied Physics 14 (10) 626 (1963)
https://doi.org/10.1088/0508-3443/14/10/307

A Monte Carlo Calculation of the Spatial Distribution of Characteristic X-ray Production in a Solid Target

M Green
Proceedings of the Physical Society 82 (2) 204 (1963)
https://doi.org/10.1088/0370-1328/82/2/307

On the Absolute Intensity of Emission of Characteristic X Radiation

V Metchnik and S G Tomlin
Proceedings of the Physical Society 81 (5) 956 (1963)
https://doi.org/10.1088/0370-1328/81/5/321

The Problem of Determining the Optical Rotation of Highly Scattering Solutions.

A. L. Rouy, Benjamin. Carroll and T. J. Quigley
Analytical Chemistry 35 (6) 627 (1963)
https://doi.org/10.1021/ac60199a039

The present state of quantitative X-ray microanalysis Part 1: Physical basis

P Duncumb and P K Shields
British Journal of Applied Physics 14 (10) 617 (1963)
https://doi.org/10.1088/0508-3443/14/10/306

X-ray Optics and X-ray Microanalysis

G.D. ARCHARD and T. MULVEY
X-ray Optics and X-ray Microanalysis 393 (1963)
https://doi.org/10.1016/B978-1-4832-3322-2.50040-8

X-ray Optics and X-ray Microanalysis

R.R. DILS, L. ZEITZ and R.A. HUGGINS
X-ray Optics and X-ray Microanalysis 341 (1963)
https://doi.org/10.1016/B978-1-4832-3322-2.50037-8

X-ray Optics and X-ray Microanalysis

M. GREEN
X-ray Optics and X-ray Microanalysis 361 (1963)
https://doi.org/10.1016/B978-1-4832-3322-2.50038-X

X-ray Optics and X-ray Microanalysis

A. KIRIANENKO, F. MAURICE, D. CALAIS and Y. ADDA
X-ray Optics and X-ray Microanalysis 559 (1963)
https://doi.org/10.1016/B978-1-4832-3322-2.50055-X

Bani R. Banerjee
190 (1962)
https://doi.org/10.1520/STP43687S

SCANNING ELECTRON AND X‐RAY MICROSCOPY*

V. E. Cosslett
Annals of the New York Academy of Sciences 97 (2) 464 (1962)
https://doi.org/10.1111/j.1749-6632.1962.tb34657.x

Mining Research

K.D. PHAN and M. CAPITANT
Mining Research 399 (1962)
https://doi.org/10.1016/B978-1-4832-8307-4.50033-7

Interpretation of Range Measurements for Kilovolt Electrons in Solids

H. Kanter and E. J. Sternglass
Physical Review 126 (2) 620 (1962)
https://doi.org/10.1103/PhysRev.126.620

Electron Probe Intensity Calculations for 20–50 Kev Electrons

L. S. Birks
Journal of Applied Physics 33 (1) 233 (1962)
https://doi.org/10.1063/1.1728500

Measuring thickness and composition of thin surface films by means of an electron probe

B.W Schumacher and S.S Mitra
Microelectronics Reliability 1 (4) 321 (1962)
https://doi.org/10.1016/0026-2714(62)90036-7

Calculation of X-Ray Intensities from Electron Probe Specimens

L. S. Birks
Journal of Applied Physics 32 (3) 387 (1961)
https://doi.org/10.1063/1.1736015

The Efficiency of Production of Characteristic X-radiation in Thick Targets of a Pure Element

M Green and V E Cosslett
Proceedings of the Physical Society 78 (6) 1206 (1961)
https://doi.org/10.1088/0370-1328/78/6/315

Advances in X-Ray Analysis

R. Castaing
Advances in X-Ray Analysis 351 (1961)
https://doi.org/10.1007/978-1-4684-8634-6_25

APPLICATION À L’ÉTUDE DES PIÈCES DE COLLECTION EN MÉTAL DE QUELQUES MÉTHODES NON-DESTRUCTIVES UTILISÉES EN MÉTALLURGIE

Adrienne R. Weill
Studies in Conservation 6 (sup1) 111 (1961)
https://doi.org/10.1179/sic.1961.s027

Germanium Saturated with Gallium Antimonide

J. O. McCaldin and D. B. Wittry
Journal of Applied Physics 32 (1) 65 (1961)
https://doi.org/10.1063/1.1735962

Solid State Physics

David Lazarus
Solid State Physics 10 71 (1960)
https://doi.org/10.1016/S0081-1947(08)60701-8

Electron probe methods of X-ray microanalysis

P Duncumb
British Journal of Applied Physics 11 (5) 169 (1960)
https://doi.org/10.1088/0508-3443/11/5/301

Advances in Electronics and Electron Physics Volume 13

Raymond Castaing
Advances in Electronics and Electron Physics, Advances in Electronics and Electron Physics Volume 13 13 317 (1960)
https://doi.org/10.1016/S0065-2539(08)60212-7

Electron Probe Measurements of Evaporated Metal Films

W. E. Sweeney, R. E. Seebold and L. S. Birks
Journal of Applied Physics 31 (6) 1061 (1960)
https://doi.org/10.1063/1.1735746

Laue Spectrometer for Multichannel X-Ray Spectrochemical Analysis

J. Ladell and N. Spielberg
Review of Scientific Instruments 31 (1) 23 (1960)
https://doi.org/10.1063/1.1716783

Contemporary x-ray spectral analysis

É. E. Vainshtein
Journal of Structural Chemistry 1 (3) 336 (1960)
https://doi.org/10.1007/BF00748863

The Fundamentals of Quantitative Electron-Probe Microanalysis

R. Castaing
Advances in X-ray Analysis 4 351 (1960)
https://doi.org/10.1154/S0376030800001208

The X-ray scanning microanalyser

P Duncumb
British Journal of Applied Physics 10 (9) 420 (1959)
https://doi.org/10.1088/0508-3443/10/9/310

I.—PROSPECTS FOR SUBSTANCE DIFFERENTIATION BY ELECTRON AND X‐RAY MICRO‐METHODS*

V. E. Cosslett
Journal of the Royal Microscopical Society 78 (1-2) 1 (1958)
https://doi.org/10.1111/j.1365-2818.1958.tb02031.x

Resolution of Electron Probe Microanalyzers

David B. Wittry
Journal of Applied Physics 29 (11) 1543 (1958)
https://doi.org/10.1063/1.1722990

Electron probe microanalyzer and its application to ferrous metallurgy

R. Castaing, J. Philibert and C. Crussard
JOM 9 (4) 389 (1957)
https://doi.org/10.1007/BF03397884

Article cité par

Article cité :

On the physical basis of localized [ponctuelle] analysis by X-ray spectrography.Sur les bases physiques de l'analyse ponctuelle par spectrographie X

Citations de cet article :

Electron microanalysis of metallic meteorites

Coating thickness measurement by electron probe microanalysis

Methods of Quantitative Electron Probe Analysis*

K X-ray yields from elements of low atomic number

Scanning Single-Crystal Multichannel X-Ray Spectrometer

The present state of quantitative X-ray microanalysis Part 2: Computational methods

A Monte Carlo Calculation of the Spatial Distribution of Characteristic X-ray Production in a Solid Target

On the Absolute Intensity of Emission of Characteristic X Radiation

The Problem of Determining the Optical Rotation of Highly Scattering Solutions.

The present state of quantitative X-ray microanalysis Part 1: Physical basis

X-ray Optics and X-ray Microanalysis

X-ray Optics and X-ray Microanalysis

X-ray Optics and X-ray Microanalysis

X-ray Optics and X-ray Microanalysis

SCANNING ELECTRON AND X‐RAY MICROSCOPY*

Mining Research

Interpretation of Range Measurements for Kilovolt Electrons in Solids

Electron Probe Intensity Calculations for 20–50 Kev Electrons

Measuring thickness and composition of thin surface films by means of an electron probe

Calculation of X-Ray Intensities from Electron Probe Specimens

The Efficiency of Production of Characteristic X-radiation in Thick Targets of a Pure Element

Advances in X-Ray Analysis

APPLICATION À L’ÉTUDE DES PIÈCES DE COLLECTION EN MÉTAL DE QUELQUES MÉTHODES NON-DESTRUCTIVES UTILISÉES EN MÉTALLURGIE

Germanium Saturated with Gallium Antimonide

Solid State Physics

Electron probe methods of X-ray microanalysis

Advances in Electronics and Electron Physics Volume 13

Electron Probe Measurements of Evaporated Metal Films

Laue Spectrometer for Multichannel X-Ray Spectrochemical Analysis

Contemporary x-ray spectral analysis

The Fundamentals of Quantitative Electron-Probe Microanalysis

The X-ray scanning microanalyser

I.—PROSPECTS FOR SUBSTANCE DIFFERENTIATION BY ELECTRON AND X‐RAY MICRO‐METHODS*

Resolution of Electron Probe Microanalyzers

Electron probe microanalyzer and its application to ferrous metallurgy

On the physical basis of localized [ponctuelle] analysis by X-ray spectrography.
Sur les bases physiques de l'analyse ponctuelle par spectrographie X