Journal de Physique et Le Radium

Quantitative, Spectro-kinetic Analysis of Oxygen in Electron-Beam Sensitive, Multimetallic Oxide Nanostructures

Miguel López-Haro, Isabel Gómez-Recio, Huiyan Pan, et al.
Microscopy and Microanalysis 29 (3) 900 (2023)
https://doi.org/10.1093/micmic/ozad037

Jürgen Thomas and Thomas Gemming
261 (2023)
https://doi.org/10.1007/978-3-662-66723-1_10

An analytical model for fluorescent and scattering X-ray beam monitor designing

E. Sacchetti, K. Desjardins and K. Medjoubi
Journal of Instrumentation 18 (01) C01006 (2023)
https://doi.org/10.1088/1748-0221/18/01/C01006

Average K-, L-, and M-shell fluorescence yields: A new semi-empirical formulae

K. Meddouh, S. Daoudi, A. Kahoul, J.M. Sampaio, J.P. Marques, F. Parente, N.Kup Aylikci, V. Aylikci, Y. Kasri and A. Hamidani
Radiation Physics and Chemistry 202 110481 (2023)
https://doi.org/10.1016/j.radphyschem.2022.110481

Updated database, new empirical and theoretical values of average L shell fluorescence yields of elements with 23≤Z≤96

Y. Sahnoune, A. Kahoul, S. Daoudi, J.M. Sampaio, N. Kup Aylikci, V. Aylikci, Y. Kasri, B. Deghfel, J.P. Marques and D.E. Medjadi
Radiation Physics and Chemistry 166 108495 (2020)
https://doi.org/10.1016/j.radphyschem.2019.108495

Quantitative Microbeam Analysis

J. L. Campbell
Quantitative Microbeam Analysis 303 (2017)
https://doi.org/10.1201/9780203741528-13

K-shell fluorescence yields and their uncertainties for use in hybrid K-edge densitometry

Andrew Nicholson, Stephen Croft and Robert D. McElroy
Journal of Radioanalytical and Nuclear Chemistry 307 (3) 2069 (2016)
https://doi.org/10.1007/s10967-015-4543-1

L 1 , L 2 , and L 3 subshell fluorescence yields: Updated database and new empirical values

Y. Sahnoune, A. Kahoul, Y. Kasri, et al.
Radiation Physics and Chemistry 125 227 (2016)
https://doi.org/10.1016/j.radphyschem.2016.04.016

New K-shell fluorescence yields curve for elements with 3 ≤ Z ≤ 99

Salim Daoudi, Abdelhalim Kahoul, Yassine Sahnoune, et al.
Journal of the Korean Physical Society 67 (9) 1537 (2015)
https://doi.org/10.3938/jkps.67.1537

Ytterbium to thorium semi-empirical average M-shell fluorescence yields

F. Khalfallah, B. Deghfel, A. Kahoul, et al.
Radiation Physics and Chemistry 112 71 (2015)
https://doi.org/10.1016/j.radphyschem.2015.03.021

New empirical formulae for calculation of average M-shell fluorescence yields

A. Kahoul, V. Aylikci, B. Deghfel, N. Küp Aylikci and M. Nekkab
Journal of Quantitative Spectroscopy and Radiative Transfer 145 205 (2014)
https://doi.org/10.1016/j.jqsrt.2014.05.009

Analytical Transmission Electron Microscopy

Jürgen Thomas and Thomas Gemming
Analytical Transmission Electron Microscopy 227 (2014)
https://doi.org/10.1007/978-94-017-8601-0_10

Alloying effect on K X-ray intensity ratio and production cross section values of Zn and Cr in ZnCr alloys

M. Dogan, E. Tirasoglu, İ.H. Karahan, et al.
Radiation Physics and Chemistry 87 6 (2013)
https://doi.org/10.1016/j.radphyschem.2013.01.027

Updated database and new empirical values for K-shell fluorescence yields

A. Kahoul, V. Aylikci, N. Kup Aylikci, E. Cengiz and G. Apaydın
Radiation Physics and Chemistry 81 (7) 713 (2012)
https://doi.org/10.1016/j.radphyschem.2012.03.006

K-shell fluorescence yields for elements with 6≤Z≤99

A. Kahoul, A. Abassi, B. Deghfel and M. Nekkab
Radiation Physics and Chemistry 80 (3) 369 (2011)
https://doi.org/10.1016/j.radphyschem.2010.11.011

Effect ofpH treatment onK-shell x-ray intensity ratios andK-shell x-ray-production cross sections in ZnCo alloys

N. Kup Aylikci, V. Aylikci, A. Kahoul, et al.
Physical Review A 84 (4) (2011)
https://doi.org/10.1103/PhysRevA.84.042509

Quantitative sampling and analysis of trace elements in atmospheric aerosols: impactor characterization and Synchrotron-XRF mass calibration

A. Richard, N. Bukowiecki, P. Lienemann, M. Furger, M. Fierz, M. C. Minguillón, B. Weideli, R. Figi, U. Flechsig, K. Appel, A. S. H. Prévôt and U. Baltensperger
Atmospheric Measurement Techniques 3 (5) 1473 (2010)
https://doi.org/10.5194/amt-3-1473-2010

Surfaces and Interfaces of Electronic Materials

Surfaces and Interfaces of Electronic Materials 147 (2010)
https://doi.org/10.1002/9783527665709.ch9

Quantitative sampling and analysis of trace elements in ambient air: impactor characterization and Synchrotron-XRF mass calibration

A. Richard, N. Bukowiecki, P. Lienemann, et al.
Atmospheric Measurement Techniques Discussions 3 (3) 2477 (2010)
https://doi.org/10.5194/amtd-3-2477-2010

Simulation of electron spectra for surface analysis (SESSA): a novel software tool for quantitative Auger‐electron spectroscopy and X‐ray photoelectron spectroscopy

Werner Smekal, Wolfgang S. M. Werner and Cedric J. Powell
Surface and Interface Analysis 37 (11) 1059 (2005)
https://doi.org/10.1002/sia.2097

Monte Carlo simulation of electron interaction with a thin film

Vladimı́r Starý
Thin Solid Films 433 (1-2) 326 (2003)
https://doi.org/10.1016/S0040-6090(03)00336-5

Measurement of K-shell production cross sections for Ga, Ge and Zr elements by electron impact

Changgeng Zhou, Zhu An and Zhengming Luo
Journal of Physics B: Atomic, Molecular and Optical Physics 35 (4) 841 (2002)
https://doi.org/10.1088/0953-4075/35/4/309

X-ray microanalysis of organic thin sections in TEM using an UTW Si(Li) detector: Comparison of quantification methods

Patrice Laquerriere, Vincent Banchet, Jean Michel, et al.
Microscopy Research and Technique 52 (2) 231 (2001)
https://doi.org/10.1002/1097-0029(20010115)52:2<231::AID-JEMT1008>3.0.CO;2-F

TRIALS TO IMPROVE THE CONTINUUM WAVEFUNCTIONS OF AUGER ELECTRONS EMITTED FROM ALUMINIUM AND OXYGEN IONS USING A LEAST SQUARES VARIATIONAL TECHNIQUE

M. A. ABDEL-RAOUF, S. Y. EL-BAKRY and M. Y. EL-BAKRY
Modern Physics Letters B 14 (25n26) 877 (2000)
https://doi.org/10.1142/S021798490000118X

Scanning Electron Microscopy

Ludwig Reimer
Springer Series in Optical Sciences, Scanning Electron Microscopy 45 379 (1998)
https://doi.org/10.1007/978-3-540-38967-5_10

Nuclear Methods in Mineralogy and Geology

S. Nagy, K. Süvegh and A. Vértes
Nuclear Methods in Mineralogy and Geology 1 (1998)
https://doi.org/10.1007/978-1-4615-5363-2_1

X-Ray Spectrometry in Electron Beam Instruments

K. F. J. Heinrich
X-Ray Spectrometry in Electron Beam Instruments 305 (1995)
https://doi.org/10.1007/978-1-4615-1825-9_18

Standardless quantitation of thin film specimens

W. A. Patrick Nicholson
Mikrochimica Acta 114-115 (1) 53 (1994)
https://doi.org/10.1007/BF01244533

Auger electron spectroscopy

Ch. Linsmeier
Vacuum 45 (6-7) 673 (1994)
https://doi.org/10.1016/0042-207X(94)90108-2

Signal-to-background in EPMA: Measurement and Monte Carlo calculation

Vladimir Stary
Mikrochimica Acta 114-115 (1) 463 (1994)
https://doi.org/10.1007/BF01244573

Surface heating by short X-ray pulses

V. V. Beloshitsky, R. F. Fayazov and M. A. Kumakhov
Radiation Effects and Defects in Solids 125 (1-3) 241 (1993)
https://doi.org/10.1080/10420159308225505

Introduction to Surface Physical Chemistry

Klaus Christmann
Topics in Physical Chemistry, Introduction to Surface Physical Chemistry 1 84 (1991)
https://doi.org/10.1007/978-3-662-08009-2_4

Spectroscopic Characterization of Heterogeneous Catalysts - Methods of Surface Analysis

J. Alvarez and M.C. Asensio
Studies in Surface Science and Catalysis, Spectroscopic Characterization of Heterogeneous Catalysts - Methods of Surface Analysis 57 A79 (1990)
https://doi.org/10.1016/S0167-2991(08)63995-6

Quantitative X-ray fluorescence analysis of boron in thin films of borophosphosilicate glasses

M. Schuster, L. Müller, K.E. Mauser and R. Straub
Thin Solid Films 157 (2) 325 (1988)
https://doi.org/10.1016/0040-6090(88)90013-2

Investigations towards optimizing EDS analysis by the Cliff‐Lorimer method in scanning transmission electron microscopy

H. Hoeft and P. Schwaab
X-Ray Spectrometry 17 (5) 201 (1988)
https://doi.org/10.1002/xrs.1300170509

Thin film standardless analysis used in TEM asbestos EDS analysis

X. Li, J. Xingxing, W. Zi-qin, et al.
Proceedings, annual meeting, Electron Microscopy Society of America 46 966 (1988)
https://doi.org/10.1017/S0424820100106892

A study of factors influencing the accuracy of quantitative X‐ray analysis of thin foil specimens

G. Wirmark and H. Nordén
Journal of Microscopy 148 (2) 167 (1987)
https://doi.org/10.1111/j.1365-2818.1987.tb02864.x

Quantitative energy dispersive x‐ray micro‐analysis of thin metal specimens using the STEM

P. Schwaab
Scanning 9 (1) 1 (1987)
https://doi.org/10.1002/sca.4950090102

Quantitative X-ray microanalysis of thin specimens in the transmission electron microscope; a review

G. W. Lorimer
Mineralogical Magazine 51 (359) 49 (1987)
https://doi.org/10.1180/minmag.1987.051.359.05

Semiquantitative evaluation of histochemically detectable calcium binding in mammalian brain slices

A. Mihály, U. Kuhnt, L. Siklós and F. Joó
Journal of Neuroscience Methods 20 (4) 283 (1987)
https://doi.org/10.1016/0165-0270(87)90061-6

Quantitative X‐ray microanalysis of thin foils in STEM

W. E. Voice, T. J. Bradshaw and R. G. Faulkner
X-Ray Spectrometry 15 (2) 121 (1986)
https://doi.org/10.1002/xrs.1300150210

Principles of Analytical Electron Microscopy

J. I. Goldstein, D. B. Williams and G. Cliff
Principles of Analytical Electron Microscopy 155 (1986)
https://doi.org/10.1007/978-1-4899-2037-9_5

Scanning Electron Microscopy

Ludwig Reimer
Springer Series in Optical Sciences, Scanning Electron Microscopy 45 128 (1985)
https://doi.org/10.1007/978-3-662-13562-4_4

A new method of measuring the K-shell fluorescence yield of As

K Singh and H S Sahota
Journal of Physics G: Nuclear Physics 10 (2) 241 (1984)
https://doi.org/10.1088/0305-4616/10/2/014

Experimental K-shell fluorescence yield of monocrystalline germanium

E Casnati, A Tartari, C Baraldi and G Napoli
Journal of Physics B: Atomic and Molecular Physics 17 (12) 2413 (1984)
https://doi.org/10.1088/0022-3700/17/12/011

Determination of Cliff‐Lorimer k factors by analysis of crystallized microdroplets

R. J. Graham and J. W. Steeds
Journal of Microscopy 133 (3) 275 (1984)
https://doi.org/10.1111/j.1365-2818.1984.tb00491.x

Experimental and theoretical determination of kAFe factors for quantitative X‐ray microanalysis in the analytical electron microscope

J. E. Wood, D. B. Williams and J. I. Goldstein
Journal of Microscopy 133 (3) 255 (1984)
https://doi.org/10.1111/j.1365-2818.1984.tb00490.x

Microanalytical Tem Studies of Ceramic Materials

Ewald Bischoff and Manfred Rühle
MRS Proceedings 41 (1984)
https://doi.org/10.1557/PROC-41-227

Fundamentals of Energy Dispersive X-ray Analysis

Fundamentals of Energy Dispersive X-ray Analysis 295 (1984)
https://doi.org/10.1016/B978-0-408-11031-0.50030-4

K-shell fluorescence yield of Cs

K. Singh, Gurmel Singh, R. K. Sharma and H. S. Sahota
Physical Review C 28 (5) 2115 (1983)
https://doi.org/10.1103/PhysRevC.28.2115

A review of on‐line processing of chemical analysis data using a conventional CTEM/STEM

A. W. Nicholls and I. P. Jones
Journal of Microscopy 127 (1) 119 (1982)
https://doi.org/10.1111/j.1365-2818.1982.tb00402.x

High resolution analytical electron microscopy

R.W. Carpenter
Ultramicroscopy 8 (1-2) 79 (1982)
https://doi.org/10.1016/0304-3991(82)90278-9

Eric Henry Stoneley Burhop, 31 January 1911 - 22 January 1980

Biographical Memoirs of Fellows of the Royal Society 27 131 (1981)
https://doi.org/10.1098/rsbm.1981.0006

A quantitative X-ray microanalysis thin film method using K-, L-, and M-lines

Thomas P. Schreiber and Andrew M. Wims
Ultramicroscopy 6 (4) 323 (1981)
https://doi.org/10.1016/S0304-3991(81)80234-3

A quantitative X-ray microanalysis thin film method using K-, L-, and M-lines

Thomas P. Schreiber and Andrew M. Wims
Ultramicroscopy 6 (1) 323 (1981)
https://doi.org/10.1016/S0304-3991(81)80219-7

Analyse de couches minces d'oxydes de titane en spectroscopie d'électrons auger

J Gandon and J.C Joud
Journal of the Less Common Metals 69 (1) 277 (1980)
https://doi.org/10.1016/0022-5088(80)90060-0

Parameters for the ratio method by x-ray microanalysis

Andras G. S. Janossy, Kristof. Kovacs and Ida. Toth
Analytical Chemistry 51 (4) 491 (1979)
https://doi.org/10.1021/ac50040a008

Diagnosis and correction of wedging errors in absorbance subtract Fourier transform infrared spectrometry

Tomas. Hirschfeld
Analytical Chemistry 51 (4) 495 (1979)
https://doi.org/10.1021/ac50040a009

A fundamental parameter method for analysis of alloys by isotope‐excited X‐ray fluorescence

M. Kis‐Varga
X-Ray Spectrometry 8 (2) 73 (1979)
https://doi.org/10.1002/xrs.1300080208

Introduction to Analytical Electron Microscopy

Nestor J. Zaluzec
Introduction to Analytical Electron Microscopy 121 (1979)
https://doi.org/10.1007/978-1-4757-5581-7_4

The Theory of Auger Transitions

The Theory of Auger Transitions 251 (1976)
https://doi.org/10.1016/B978-0-12-169850-8.50013-6

Characterization of particulate material in very pure waters

P. Biddle and J. H. Miles
Journal of Microscopy 107 (1) 93 (1976)
https://doi.org/10.1111/j.1365-2818.1976.tb02427.x

Advances in Geophysics Volume 16

D.G.W. Smith and J.C. Rucklidge
Advances in Geophysics, Advances in Geophysics Volume 16 16 57 (1973)
https://doi.org/10.1016/S0065-2687(08)60351-9

X-Ray Fluorescence Yields, Auger, and Coster-Kronig Transition Probabilities

WALTER BAMBYNEK, BERND CRASEMANN, R. W. FINK, et al.
Reviews of Modern Physics 44 (4) 716 (1972)
https://doi.org/10.1103/RevModPhys.44.716

Bertimmung des Zinngehaltes von Erztrüben mit Hilfe der Röntgenfluoreszenz-anregung durch eine Radionuklid-Röntgenquelle

G. Brunner, E. Dahn and G. Krüger
Isotopenpraxis Isotopes in Environmental and Health Studies 8 (8) 300 (1972)
https://doi.org/10.1080/10256017208623096

49 (1972)
https://doi.org/10.1520/STP37403S

Advances in Atomic and Molecular Physics Volume 8

E.H.S. Burhop and W.N. Asaad
Advances in Atomic and Molecular Physics, Advances in Atomic and Molecular Physics Volume 8 8 163 (1972)
https://doi.org/10.1016/S0065-2199(08)60021-4

LII-Subshell Yields of Uranium and Radium

F. B. Gil, A. Barroso, J. C. Soares and J. G. Ferreira
Physical Review A 5 (2) 536 (1972)
https://doi.org/10.1103/PhysRevA.5.536

Electron-probe microanalysis: The relation between intensity ratio and concentration

P. M. Martin and D. M. Poole
Metallurgical Reviews 16 (1) 19 (1971)
https://doi.org/10.1179/mtlr.1971.16.1.19

The fluorescence, Auger, and Coster Kronig LIIsubshell yields of thorium

J G Ferreira, J C Soares, A Barroso and F B Gil
Journal of Physics A: General Physics 4 (5) 679 (1971)
https://doi.org/10.1088/0305-4470/4/5/010

Experimental K-Fluorescence Yields for the Elements Z = 22 to 30 and 32

P. Suortti
Journal of Applied Physics 42 (13) 5821 (1971)
https://doi.org/10.1063/1.1660016

Measurement of the activity of the manganese-54 radionuclide in a source

E. A. Aristov and N. F. Zhdanova
Measurement Techniques 14 (11) 1729 (1971)
https://doi.org/10.1007/BF00997873

Atomic Radiation Transition Probabilities to the1sState and TheoreticalK-Shell Fluorescence Yields

Vaclav O. Kostroun, Mau Hsiung Chen and Bernd Crasemann
Physical Review A 3 (2) 533 (1971)
https://doi.org/10.1103/PhysRevA.3.533

Critical examination of computer programs used in quantitative electron microprobe analysis

Donald R. Beaman and J. A. Isasi
Analytical Chemistry 42 (13) 1540 (1970)
https://doi.org/10.1021/ac60295a021

Measurements of the ultrasoft X-ray absorption of Ar, Ne, N2, O2, CH4, He and H2

D R Denne
Journal of Physics D: Applied Physics 3 (9) 1392 (1970)
https://doi.org/10.1088/0022-3727/3/9/323

K-Shell Fluorescence Yields for Light Elements

C. E. Dick and A. C. Lucas
Physical Review A 2 (3) 580 (1970)
https://doi.org/10.1103/PhysRevA.2.580

The K-shell fluorescence yield and atomic shell structure effects

J Byrne and N Howarth
Journal of Physics B: Atomic and Molecular Physics 3 (2) 280 (1970)
https://doi.org/10.1088/0022-3700/3/2/021

The decay of 75Se

D.E. Raeside, M.A. Ludington, J.J. Reidy and M.L. Wiedenbeck
Nuclear Physics A 130 (3) 677 (1969)
https://doi.org/10.1016/0375-9474(69)90878-1

Röntgen-Ausbeuten bei α-Anregung

G. Brunner
Isotopenpraxis Isotopes in Environmental and Health Studies 4 (12) 455 (1968)
https://doi.org/10.1080/10256016808552043

Advances in Agronomy

Michel P. Cescas, Edward H. Tyner and Lawrence J. Gray
Advances in Agronomy 20 153 (1968)
https://doi.org/10.1016/S0065-2113(08)60856-1

Decay of 121mSn and 121Sn

R.E. Snyder and G.B. Beard
Nuclear Physics A 113 (3) 581 (1968)
https://doi.org/10.1016/0375-9474(68)90166-8

L2-Subshell Yield Measurements inPu240,U236, andU234

J. Byrne, W. Gelletly, M. A. S. Ross and F. Shaikh
Physical Review 170 (1) 80 (1968)
https://doi.org/10.1103/PhysRev.170.80

Advances in X-ray Analysis

J. W. Colby
Advances in X-ray Analysis 287 (1968)
https://doi.org/10.1007/978-1-4684-8676-6_22

Auger-vacancy satellites in the decay of 21082Pb (RaD)

S.K. Haynes, M. Velinsky and L.J. Velinsky
Nuclear Physics A 90 (3) 573 (1967)
https://doi.org/10.1016/0375-9474(67)90063-2

Quantitative Microprobe Analysis of Thin Insulating Films

J. W. Colby
Advances in X-ray Analysis 11 287 (1967)
https://doi.org/10.1154/S0376030800004924

On the Intensities of X-Ray Kα Satellites of Neon

Masao Sawada
Journal of the Physical Society of Japan 23 (4) 865 (1967)
https://doi.org/10.1143/JPSJ.23.865

Orbital electron captures in 57Co and the K-fluorescence yield of iron

Ambuj Mukerji and James B. McGough
Nuclear Physics A 94 (1) 95 (1967)
https://doi.org/10.1016/0375-9474(67)90811-1

THE HALF-LIVES OF THE 243-keV AND 188-keV LEVELS IN 125I

Y. S. Horowitz, R. B. Moore and R. Barton
Canadian Journal of Physics 45 (1) 101 (1967)
https://doi.org/10.1139/p67-011

Orbital electron captures in 51Cr and 65Zn and the K-fluorescence yields of V and Cu

Ambuj Mukerji, James B. McGough and Georged D. Cole
Nuclear Physics A 100 (1) 81 (1967)
https://doi.org/10.1016/0375-9474(67)90355-7

Atomic Fluorescence Yields

R. W. FINK, R. C. JOPSON, HANS MARK and C. D. SWIFT
Reviews of Modern Physics 38 (3) 513 (1966)
https://doi.org/10.1103/RevModPhys.38.513

Soft X-Ray Production by 1.5-MeV Protons

W. T. Ogier, G. J. Lucas, J. S. Murray and T. E. Holzer
Physical Review 134 (4A) A1070 (1964)
https://doi.org/10.1103/PhysRev.134.A1070

K X-ray yields from elements of low atomic number

Proceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences 274 (1358) 319 (1963)
https://doi.org/10.1098/rspa.1963.0135

Radioactivity induced in Discoverer 17 by solar-flare protons

James E. Keith and Anthony L. Turkevich
Journal of Geophysical Research 67 (12) 4525 (1962)
https://doi.org/10.1029/JZ067i012p04525

Measurements on the K fluorescence yield of Cr, Mn, Cu and Ga

P. Kramer, A. De Beer, Miss E.C. Bos and J. Blok
Physica 28 (6) 582 (1962)
https://doi.org/10.1016/0031-8914(62)90112-X

Röntgen‐K‐ und LIII Niveaubreiten

Armin Meisel and Wadim Nefedow
Annalen der Physik 464 (1-2) 48 (1961)
https://doi.org/10.1002/andp.19614640106

KLLAuger Transition Probabilities

Edwin J. Callan
Physical Review 124 (3) 793 (1961)
https://doi.org/10.1103/PhysRev.124.793

Form und Breite von Röntgenemissionslinien

Armin Meisel and Wadim Nefedow
Zeitschrift für Chemie 1 (11) 337 (1961)
https://doi.org/10.1002/zfch.19610011107

Orbital electron capture by the nucleus

R Bouchez and P Depommier
Reports on Progress in Physics 23 (1) 395 (1960)
https://doi.org/10.1088/0034-4885/23/1/308

Conversion, K-Auger, and L-Auger Spectra of Hg¹⁹⁹

J. C. Nall, Q. L. Baird, and S. K. Haynes
Physical Review 118 (5) 1278 (1960)
https://doi.org/10.1103/PhysRev.118.1278

Measurements of the fluorescent yield of the K-shell with a proportional counter

H.L. Hagedoorn and A.H. Wapstra
Nuclear Physics 15 146 (1960)
https://doi.org/10.1016/0029-5582(60)90292-3

Article cité par

Article cité :

The fluorescence yield.Le rendement de fluorescence

Citations de cet article :

Quantitative, Spectro-kinetic Analysis of Oxygen in Electron-Beam Sensitive, Multimetallic Oxide Nanostructures

An analytical model for fluorescent and scattering X-ray beam monitor designing

Average K-, L-, and M-shell fluorescence yields: A new semi-empirical formulae

Updated database, new empirical and theoretical values of average L shell fluorescence yields of elements with 23≤Z≤96

Quantitative Microbeam Analysis

K-shell fluorescence yields and their uncertainties for use in hybrid K-edge densitometry

L 1 , L 2 , and L 3 subshell fluorescence yields: Updated database and new empirical values

New K-shell fluorescence yields curve for elements with 3 ≤ Z ≤ 99

Ytterbium to thorium semi-empirical average M-shell fluorescence yields

New empirical formulae for calculation of average M-shell fluorescence yields

Analytical Transmission Electron Microscopy

Alloying effect on K X-ray intensity ratio and production cross section values of Zn and Cr in ZnCr alloys

Updated database and new empirical values for K-shell fluorescence yields

K-shell fluorescence yields for elements with 6≤Z≤99

Effect ofpH treatment onK-shell x-ray intensity ratios andK-shell x-ray-production cross sections in ZnCo alloys

Quantitative sampling and analysis of trace elements in atmospheric aerosols: impactor characterization and Synchrotron-XRF mass calibration

Surfaces and Interfaces of Electronic Materials

Quantitative sampling and analysis of trace elements in ambient air: impactor characterization and Synchrotron-XRF mass calibration

Simulation of electron spectra for surface analysis (SESSA): a novel software tool for quantitative Auger‐electron spectroscopy and X‐ray photoelectron spectroscopy

Monte Carlo simulation of electron interaction with a thin film

Measurement of K-shell production cross sections for Ga, Ge and Zr elements by electron impact

X-ray microanalysis of organic thin sections in TEM using an UTW Si(Li) detector: Comparison of quantification methods

TRIALS TO IMPROVE THE CONTINUUM WAVEFUNCTIONS OF AUGER ELECTRONS EMITTED FROM ALUMINIUM AND OXYGEN IONS USING A LEAST SQUARES VARIATIONAL TECHNIQUE

Scanning Electron Microscopy

Nuclear Methods in Mineralogy and Geology

X-Ray Spectrometry in Electron Beam Instruments

Standardless quantitation of thin film specimens

Auger electron spectroscopy

Signal-to-background in EPMA: Measurement and Monte Carlo calculation

Surface heating by short X-ray pulses

Introduction to Surface Physical Chemistry

Spectroscopic Characterization of Heterogeneous Catalysts - Methods of Surface Analysis

Quantitative X-ray fluorescence analysis of boron in thin films of borophosphosilicate glasses

Investigations towards optimizing EDS analysis by the Cliff‐Lorimer method in scanning transmission electron microscopy

Thin film standardless analysis used in TEM asbestos EDS analysis

A study of factors influencing the accuracy of quantitative X‐ray analysis of thin foil specimens

Quantitative energy dispersive x‐ray micro‐analysis of thin metal specimens using the STEM

Quantitative X-ray microanalysis of thin specimens in the transmission electron microscope; a review

Semiquantitative evaluation of histochemically detectable calcium binding in mammalian brain slices

Quantitative X‐ray microanalysis of thin foils in STEM

Principles of Analytical Electron Microscopy

Scanning Electron Microscopy

A new method of measuring the K-shell fluorescence yield of As

Experimental K-shell fluorescence yield of monocrystalline germanium

Determination of Cliff‐Lorimer k factors by analysis of crystallized microdroplets

Experimental and theoretical determination of kAFe factors for quantitative X‐ray microanalysis in the analytical electron microscope

Microanalytical Tem Studies of Ceramic Materials

Fundamentals of Energy Dispersive X-ray Analysis

K-shell fluorescence yield of Cs

A review of on‐line processing of chemical analysis data using a conventional CTEM/STEM

High resolution analytical electron microscopy

Eric Henry Stoneley Burhop, 31 January 1911 - 22 January 1980

A quantitative X-ray microanalysis thin film method using K-, L-, and M-lines

A quantitative X-ray microanalysis thin film method using K-, L-, and M-lines

Analyse de couches minces d'oxydes de titane en spectroscopie d'électrons auger

Parameters for the ratio method by x-ray microanalysis

Diagnosis and correction of wedging errors in absorbance subtract Fourier transform infrared spectrometry

A fundamental parameter method for analysis of alloys by isotope‐excited X‐ray fluorescence

Introduction to Analytical Electron Microscopy

The Theory of Auger Transitions

Characterization of particulate material in very pure waters

Advances in Geophysics Volume 16

X-Ray Fluorescence Yields, Auger, and Coster-Kronig Transition Probabilities

Bertimmung des Zinngehaltes von Erztrüben mit Hilfe der Röntgenfluoreszenz-anregung durch eine Radionuklid-Röntgenquelle

Advances in Atomic and Molecular Physics Volume 8

LII-Subshell Yields of Uranium and Radium

Electron-probe microanalysis: The relation between intensity ratio and concentration

The fluorescence, Auger, and Coster Kronig LIIsubshell yields of thorium

Experimental K-Fluorescence Yields for the Elements Z = 22 to 30 and 32

Measurement of the activity of the manganese-54 radionuclide in a source

Atomic Radiation Transition Probabilities to the1sState and TheoreticalK-Shell Fluorescence Yields

Critical examination of computer programs used in quantitative electron microprobe analysis

Measurements of the ultrasoft X-ray absorption of Ar, Ne, N2, O2, CH4, He and H2

K-Shell Fluorescence Yields for Light Elements

The K-shell fluorescence yield and atomic shell structure effects

The decay of 75Se

The fluorescence yield.
Le rendement de fluorescence

Conversion, K-Auger, and L-Auger Spectra of Hg¹⁹⁹