La fonctionnalité Article cité par… liste les citations d'un article. Ces citations proviennent de la base de données des articles de EDP Sciences, ainsi que des bases de données d'autres éditeurs participant au programme CrossRef Cited-by Linking Program . Vous pouvez définir une alerte courriel pour être prévenu de la parution d'un nouvel article citant " cet article (voir sur la page du résumé de l'article le menu à droite).
Article cité :
F. Abflès
J. Phys. Radium, 19 3 (1958) 327-334
Citations de cet article :
29 articles
Dielectric mirror optimization based on the phase-compensation method
O del Barco, I J Sola, E Conejero Jarque and J M Bueno Journal of Optics 21 (9) 095101 (2019) https://doi.org/10.1088/2040-8986/ab386e
Phase properties of high-reflectance two-material periodic mirrors: application to oblique-incidence tunable filters
Frédéric Lemarquis Applied Optics 52 (12) 2780 (2013) https://doi.org/10.1364/AO.52.002780
DETERMINATION OF OPTICAL TRANSMISSION LOSS IN POLY (3-METHYL THIOPHENE) THIN FILM PLANAR WAVEGUIDE: EFFECT OF VAPOUR CHOPPING
Sandip V. Kamat, Sikandar H. Tamboli, Vijaya Puri, et al. Progress In Electromagnetics Research M 18 197 (2011) https://doi.org/10.2528/PIERM11032501
Optical properties of vapour chopped and nonchopped tin oxide thin films
Rahul Bharamgonda Patil, J.B. Yadav, R.K. Puri and Vijaya Puri Vacuum 83 (11) 1355 (2009) https://doi.org/10.1016/j.vacuum.2009.04.046
Properties of vacuum evaporated vapour chopped polyaniline thin film: effect of synthesis method
J B Yadav, S Jhadav, R K Puri and V Puri Journal of Physics: Conference Series 114 012037 (2008) https://doi.org/10.1088/1742-6596/114/1/012037
Effect of chopping on the properties of bismuth oxide thin films
R.B. Patil, R.K. Puri and Vijaya Puri Materials Letters 62 (2) 198 (2008) https://doi.org/10.1016/j.matlet.2007.04.102
Studies on spin coated PANI/PMMA composite thin film: Effect of post-deposition heating
J.B. Yadav, R.B. Patil, R.K. Puri and Vijaya Puri Applied Surface Science 255 (5) 2825 (2008) https://doi.org/10.1016/j.apsusc.2008.08.015
Optical and mechanical properties of vacuum evaporated vapour chopped polyaniline thin film
J.B. Yadav, R.K. Puri and V. Puri Applied Surface Science 253 (20) 8474 (2007) https://doi.org/10.1016/j.apsusc.2007.04.022
Optical properties of the chopped and non-chopped vacuum evaporated polyaniline thin film
J.B. Yadav, R.B. Patil, R.K. Puri and Vijaya Puri Journal of Non-Crystalline Solids 353 (52-54) 4691 (2007) https://doi.org/10.1016/j.jnoncrysol.2007.06.060
Optical properties and adhesion of air oxidized vacuum evaporated bismuth thin films
R.B. Patil, J.B. Yadav, R.K. Puri and Vijaya Puri Journal of Physics and Chemistry of Solids 68 (4) 665 (2007) https://doi.org/10.1016/j.jpcs.2007.02.019
Oxidation temperature dependent optical properties of bismuth oxide thin films: Effect of vapour chopping and air exposure
R.B. Patil, R.K. Puri and Vijaya Puri Applied Surface Science 253 (21) 8682 (2007) https://doi.org/10.1016/j.apsusc.2007.04.041
Phase shift on reflection from metallodielectric photonic bandgap materials
M. Golosovsky, Y. Neve-Oz, D. Davidov and A. Frenkel Physical Review B 70 (11) (2004) https://doi.org/10.1103/PhysRevB.70.115105
Refractive index of colored films of molybdenum trioxide
C. Reyes-Betanzo, J. L. Herrera-Pérez, Gregorio H. Cocoletzi and O. Zelaya-Angel Journal of Applied Physics 88 (1) 223 (2000) https://doi.org/10.1063/1.373646
Studies on MgO-stabilized zirconia thin films in the UV-visible region
F. Tcheliebou, A. Boyer and L. Martin Thin Solid Films 249 (1) 86 (1994) https://doi.org/10.1016/0040-6090(94)90090-6
Multilayer reflectors with minimal dispersion of differential phase shift upon reflection
F. Abelès and P. Baumeister Optics Communications 93 (1-2) 1 (1992) https://doi.org/10.1016/0030-4018(92)90118-B
Florin Abelès and Philip Baumeister OMB4 (1992) https://doi.org/10.1364/OIC.1992.OMB4
Thin film coating design and fabrication of broadband dielectric coated laser mirror
K N Chopra and K V Narasimham Journal of Optics 17 (2) 107 (1986) https://doi.org/10.1088/0150-536X/17/2/006
Thin film studies of oxides by the organometallic-CVD technique
Hari Prakash Progress in Crystal Growth and Characterization 6 (4) 371 (1983) https://doi.org/10.1016/0146-3535(83)90014-X
A High-precision Adaptation of the 'Turning-point' Method of Monitoring the Optical Thickness of Dielectric Layers Using Microprocessors
D.R. Gibson, P.H. Lissberger, I. Salter and D.G. Sparks Optica Acta: International Journal of Optics 29 (2) 221 (1982) https://doi.org/10.1080/713820821
Influence de la Dispersion des Indices sur le Contrôle des Couches Minces Diélectriques par la méthode des Rapports Stationnaires
M. Candille and J.M. Saurel Optica Acta: International Journal of Optics 26 (12) 1459 (1979) https://doi.org/10.1080/713819932
Solid State Physics
Methods in Experimental Physics, Solid State Physics 11 619 (1974) https://doi.org/10.1016/S0076-695X(08)60185-4
Réalisation de filtres multidiélectriques sur un substrat biréfringent, déformable et de faible épaisseur (mylar)
Jean-Marc Saurel and Marcel Candille Thin Solid Films 16 (3) 313 (1973) https://doi.org/10.1016/0040-6090(73)90085-0
Influence du Procédé de Contrôle Sur Les Tolérances de Réalisation des Filtres Interférentiels à Bande Etroite
E. Pelletier, R. Kowalczyk and A. Fornier Optica Acta: International Journal of Optics 20 (7) 509 (1973) https://doi.org/10.1080/713818800
Contr le et r alisation de rev tements multidi lectriques pr sentant des caract ristiques spectrales impos es
E Pelletier and P Giacomo Nouvelle Revue d'Optique Appliquée 3 (3) 133 (1972) https://doi.org/10.1088/0029-4780/3/3/304
Thin films of metal oxides on silicon by chemical vapor deposition with organometallic compounds. I
M. Balog, M. Schieber, S. Patai and M. Michman Journal of Crystal Growth 17 298 (1972) https://doi.org/10.1016/0022-0248(72)90260-6
Optical applications of dielectric thin films
P H Lissberger Reports on Progress in Physics 33 (1) 197 (1970) https://doi.org/10.1088/0034-4885/33/1/305
Measurements of the longitudinal magnetooptic kerr reflection of a simple multilayer structure
J. Kranz and H. Stremme IEEE Transactions on Magnetics 5 (3) 453 (1969) https://doi.org/10.1109/TMAG.1969.1066508
Sources of error in the modulated wavelength optical thickness monitor for dielectric layers
P H Lissberger Journal of Physics E: Scientific Instruments 2 (10) 875 (1969) https://doi.org/10.1088/0022-3735/2/10/310
Progress in Optics
F. Abelès Progress in Optics 2 249 (1963) https://doi.org/10.1016/S0079-6638(08)70561-4