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Cited article:

Review on 1/f noise and its research progress in two-dimensional material graphene

Ying Liu, Si-Lin Guo, Yong Zhang, et al.
Acta Physica Sinica 72 (1) 017302 (2023)
https://doi.org/10.7498/aps.72.20221253

Bayesian inference of Lévy walks via hidden Markov models

Seongyu Park, Samudrajit Thapa, Yeongjin Kim, Michael A Lomholt and Jae-Hyung Jeon
Journal of Physics A: Mathematical and Theoretical 54 (48) 484001 (2021)
https://doi.org/10.1088/1751-8121/ac31a1

Inverse integral transformation method to derive local viscosity distribution measured by optical tweezers

Ruri Hidema, Zenji Yatabe, Hikari Takahashi, Ryusei Higashikawa and Hiroshi Suzuki
Soft Matter 16 (29) 6826 (2020)
https://doi.org/10.1039/D0SM00887G

Low-frequency noise measurements at liquid helium temperature operation in ultra-thin buried oxide transistors – Physical interpretation of transport phenomena

B. Nafaa, B. Cretu, N. Ismail, et al.
Solid-State Electronics 150 1 (2018)
https://doi.org/10.1016/j.sse.2018.08.010

Comparative study of low-frequency noise in 0.18 μm and 0.35 μm gate-length nMOSFETs with gate area of 1.1 μm2

Chih-Chan Hu, Yuan-Fong Chou Chau, Chee Ming Lim and Kuang-Hsiung Tan
Microelectronics Reliability 60 10 (2016)
https://doi.org/10.1016/j.microrel.2016.02.008

1/fnoise: Implications for solid-state quantum information

E. Paladino, Y. M. Galperin, G. Falci and B. L. Altshuler
Reviews of Modern Physics 86 (2) 361 (2014)
https://doi.org/10.1103/RevModPhys.86.361

Relation Between Low-Frequency Noise and Subgap Density of States in Amorphous InGaZnO Thin-Film Transistors

Sungchul Kim, Yongwoo Jeon, Je-Hun Lee, et al.
IEEE Electron Device Letters (2010)
https://doi.org/10.1109/LED.2010.2061216

Modeling scaled processes and 1/fβnoise using nonlinear stochastic differential equations

B Kaulakys and M Alaburda
Journal of Statistical Mechanics: Theory and Experiment 2009 (02) P02051 (2009)
https://doi.org/10.1088/1742-5468/2009/02/P02051

Low-Frequency Noise In Advanced Mos Devices

Martin von Haartman and Mikael Östling
Analog Circuits and Signal Processing Series, Low-Frequency Noise In Advanced Mos Devices 1 (2007)
https://doi.org/10.1007/978-1-4020-5910-0_1

Noise decomposition in random telegraph signals using the wavelet transform

Fabio Principato and Gaetano Ferrante
Physica A: Statistical Mechanics and its Applications 380 75 (2007)
https://doi.org/10.1016/j.physa.2007.02.111

On the additivity of generation-recombination spectra Part 3: The McWhorter model for 1/f noise in MOSFETs

L.K.J. Vandamme and F.N. Hooge
Physica B: Condensed Matter 357 (3-4) 507 (2005)
https://doi.org/10.1016/j.physb.2004.09.106

Advanced Experimental Methods For Noise Research in Nanoscale Electronic Devices

M. N. Mihaila
NATO Science Series II: Mathematics, Physics and Chemistry, Advanced Experimental Methods For Noise Research in Nanoscale Electronic Devices 151 19 (2005)
https://doi.org/10.1007/1-4020-2170-4_3

Electronic noise due to multiple trap levels in homogeneous solids and in space-charge layers

Carolyne M. Van Vliet
Journal of Applied Physics 93 (10) 6068 (2003)
https://doi.org/10.1063/1.1563291

A REVIEW OF 1/f NOISE IN TERMS OF MOBILITY FLUCTUATIONS AND WHITE NOISE IN MODERN SUBMICRON BIPOLAR TRANSISTORS — BJTs AND HBTs

L. K. J. VANDAMME and GY. TREFÁN
Fluctuation and Noise Letters 01 (04) R175 (2001)
https://doi.org/10.1142/S0219477501000457

Neutron irradiation of cold GaAs devices and circuits made with an ion-implanted monolithic process

G Battistoni, D.V Camin, N Fedyakin, G Pessina and P Sala
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 388 (3) 399 (1997)
https://doi.org/10.1016/S0168-9002(96)01253-3

Flicker Noise in Oxide Cathodes Arising from Diffusion and Drift of Ionized Donors

K. M. Van Vliet and R. R. Johnson
Journal of Applied Physics 35 (7) 2039 (1964)
https://doi.org/10.1063/1.1702789