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Computer-controlled data-acquisition system for an x-ray spectrometer
J. M. André, C. Cardinaud, P. Chargelegue, F. Marcelet and C. Sénémaud Review of Scientific Instruments 57(12) 3031 (1986) https://doi.org/10.1063/1.1138987
K X-ray spectra of amorphous and crystalline silicon
Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / Ve Congrès International sur l’Optique des Rayons X et la Microanalyse
R. Barchewitz, M. Montel and C. Bonnelle Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / Ve Congrès International sur l’Optique des Rayons X et la Microanalyse 287 (1969) https://doi.org/10.1007/978-3-662-12108-5_45
Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / Ve Congrès International sur l’Optique des Rayons X et la Microanalyse
R. Barchewitz, M. Montel and C. Bonnelle Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / Ve Congrès International sur l’Optique des Rayons X et la Microanalyse 287 (1969) https://doi.org/10.1007/978-3-662-24778-5_45
X-ray small angle scattering with substances of biological interest in diluted solutions
Eine neue Kleinwinkelkamera mit fokussierenden Monochromatoren
H. Jagodzjnski and K. Wohlleben Zeitschrift für Elektrochemie, Berichte der Bunsengesellschaft für physikalische Chemie 64(2) 212 (1960) https://doi.org/10.1002/bbpc.19600640205
The MIVand MVAbsorption Edges of59Pr,60Nd,62Sm and63Eu
