The Citing articles tool gives a list of articles citing the current article.CrossRef Cited-by Linking Program
Cited article:
J. Vincent
J. Phys. Radium, 13 2 (1952) 59-67
This article has been cited by the following article(s):
30 articles
Accurate monitoring of dielectric film thickness
OS Heavens, GJ Kopek and Yuan Yi-Fang46 (2) 199 (1995)https://doi.org/10.1016/0042-207X(94)E0040-6
Thin films in Fabry-Perot interferometry
E Pelletier17 (1) 43 (1986)https://doi.org/10.1088/0150-536X/17/1/004
A High-precision Adaptation of the 'Turning-point' Method of Monitoring the Optical Thickness of Dielectric Layers Using Microprocessors
D.R. Gibson, P.H. Lissberger, I. Salter and D.G. Sparks29 (2) 221 (1982)https://doi.org/10.1080/713820821
A microprocessor-controlled magnetron system for sputtering optical films
P.J. Chandler, P.R. Meek and L. Holland86 (2-3) 183 (1981)https://doi.org/10.1016/0040-6090(81)90287-X
Monitoring of optical coatings
H. A. Macleod20 (1) 82 (1981)https://doi.org/10.1364/AO.20.000082
Refractive indices of zinc sulfide and cryolite in multilayer stacks
R. P. Netterfield15 (8) 1969 (1976)https://doi.org/10.1364/AO.15.001969
Thin film narrow band optical filters
H.A. Macleod34 (2) 335 (1976)https://doi.org/10.1016/0040-6090(76)90482-X
Detection limits and sensibility of visual interferometers
H Dupoisot and P Lostis4 (6) 373 (1973)https://doi.org/10.1088/0335-7368/4/6/309
Influence du Procédé de Contrôle Sur Les Tolérances de Réalisation des Filtres Interférentiels à Bande Etroite
E. Pelletier, R. Kowalczyk and A. Fornier20 (7) 509 (1973)https://doi.org/10.1080/713818800
Contr le et r alisation de rev tements multidi lectriques pr sentant des caract ristiques spectrales impos es
E Pelletier and P Giacomo3 (3) 133 (1972)https://doi.org/10.1088/0029-4780/3/3/304
Sur la localisation du bord de plage
Gérard Roblin1 (3) 155 (1970)https://doi.org/10.1088/0029-4780/1/3/304
Optical applications of dielectric thin films
P H Lissberger33 (1) 197 (1970)https://doi.org/10.1088/0034-4885/33/1/305
Progress in the production of optical multilayer films
P.B. Clapham4 (4) 291 (1969)https://doi.org/10.1016/0040-6090(69)90074-1
Sources of error in the modulated wavelength optical thickness monitor for dielectric layers
P H Lissberger2 (10) 875 (1969)https://doi.org/10.1088/0022-3735/2/10/310
Progress in Optics
P. Rouard and P. Bousquet4 145 (1965)https://doi.org/10.1016/S0079-6638(08)70491-8
Simple Duochromator for the Measurement of Small Displacements of a Spectral Line
Joseph G. Hirschberg4 (2) 243 (1965)https://doi.org/10.1364/AO.4.000243
Mesure simultanée des facteurs de réflexion et de transmission des couches minces, et des changements de phase correspondants
P. Bousquet, R. Deleuil and A. Gastaud25 (1-2) 31 (1964)https://doi.org/10.1051/jphys:01964002501-203101
Ergebnisse der Chirurgie und Orthopädie
W. Wenzhttps://doi.org/10.1007/978-3-642-94884-8_3
Dielectric properties of evaporated films
C. Weaver11 (42) 83 (1962)https://doi.org/10.1080/00018736200101272
Constantes optiques et structure des couches minces
P. Bousquet and P. Rouard21 (12) 873 (1960)https://doi.org/10.1051/jphysrad:019600021012087300
Apparatus for the controlled deposition of optical film systems
W. Steckelmacher, J.M. Parisot, L. Holland and T. Putner9 (3-4) 171 (1959)https://doi.org/10.1016/0042-207X(59)90189-7
Remarque sur l'influence de la dispersion dans les systèmes de couches minces diélectriques
F. Abflès19 (3) 327 (1958)https://doi.org/10.1051/jphysrad:01958001903032700
Préparation et propriétés de couches réfléchissantes pour le Fabry-Perot dans l'ultra-violet
A. Steudel19 (3) 312 (1958)https://doi.org/10.1051/jphysrad:01958001903031200
Interference filters for the infra-red
O.S. Heavens, J. Ring and S.D. Smith10 (2) 179 (1957)https://doi.org/10.1016/0371-1951(57)80185-4
Fortschritte in Leistungsf�higkeit und Anwendungsm�glichkeit des Fabry-Perot-Interferometers
Andreas Steudel44 (8) 249 (1957)https://doi.org/10.1007/BF00621089
Two-Color Monitoring Method for Reproducing Thin Film Thicknesses
Alan C. Traub46 (11) 999_1 (1956)https://doi.org/10.1364/JOSA.46.0999_1
Séchage des émulsions photographiques nucléaires par gradient de température
Roger Rechenmann17 (2) 163 (1956)https://doi.org/10.1051/jphysrad:01956001702016301
Spectrophotometry by Means of the Fabry-Perot Interferometer
P. Jacquinot and R. Chabbal46 (7) 556_1 (1956)https://doi.org/10.1364/JOSA.46.0556_1
Observations des émulsions nucléaires en lumière réfléchie
R. Rechenmann2 (5) 1104 (1955)https://doi.org/10.1007/BF02855854
Fortschritte Der Chemischen Forschung Volume 2
R. Suhrmann and H. Luther2/4 758 (1953)https://doi.org/10.1007/BFb0051791
