Journal de Physique et Le Radium

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Study of thin and surface layers by x rays : use of reflexion methods
Étude des couches minces et superficielles par les rayons X : utilisation des méthodes par réflexion

Ch. Legrand

J. Phys. Radium, 8 12 (1947) 361-368

DOI: 10.1051/jphysrad:01947008012036101

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