La fonctionnalité Article cité par… liste les citations d'un article. Ces citations proviennent de la base de données des articles de EDP Sciences, ainsi que des bases de données d'autres éditeurs participant au programme CrossRef Cited-by Linking Program
Article cité :
Raymond Castaing , Jacques Descamps
J. Phys. Radium, 16 4 (1955) 304-317
Citations de cet article :
235 articles | Pages :
Nondestructive initial-profile-free 3D elemental mapping in multilayer thin film structures based on EDX and a quadratic programming problem
Yutaka Hoshina, Yugo Kubo and Yojiro Nakayama73 (1) 66 (2024)https://doi.org/10.1093/jmicro/dfad041
In the Beginning – A Quick Look at the Origins of Quantitative Electron Microprobe Analysis and the Need for Monte Carlo Modeling
Eric Lifshin29 (Supplement_1) 478 (2023)https://doi.org/10.1093/micmic/ozad067.226
Preparation of a Cartridge-Type Pt/Al2O3 Catalyst Using a Sputter Deposition Method for Catalytic Hydrogen Combustion
Alina E. Kozhukhova, Stephanus P. du Preez, Innocent Shuro and Dmitri G. Bessarabov36 (22) 13911 (2022)https://doi.org/10.1021/acs.energyfuels.2c02584
The Beginnings of Electron Microscopy - Part 1
C. Colliex, P.W. Hawkes and P. Duncumb220 65 (2021)https://doi.org/10.1016/bs.aiep.2021.08.004
The “father” of microanalysis: Raymond Castaing, creator of a generation of scientific instruments, still in worldwide operation
Christian Colliex20 (7-8) 746 (2019)https://doi.org/10.1016/j.crhy.2018.12.001
Two-Flux Model of Charged-Particle Transport in a Condensed Material under Multiple Scattering: Average Energy Losses and Range of a Beam of Monoenergetic Electrons with Energies of 0.1 keV−1.0 MeV
N. N. Mikheev13 (4) 719 (2019)https://doi.org/10.1134/S1027451019040281
Compendium of Surface and Interface Analysis
Masaki Moritahttps://doi.org/10.1007/978-981-10-6156-1_90
Measurement of angular distributions of K x-ray intensity of Ti and Cu thick targets following impact of 10–25 keV electrons
Bhupendra Singh, Sunil Kumar, Suman Prajapati, et al. 216 17 (2017)https://doi.org/10.1016/j.elspec.2017.02.002
Universal Function of Informative-Signal Generation for Quantitative Methods of Scanning Electron Microscopy
N. N. Mikheev and A. S. Kolesnik11 (6) 1265 (2017)https://doi.org/10.1134/S1027451017050305
Determination of the Effective Detector Area of an Energy-Dispersive X-Ray Spectrometer at the Scanning Electron Microscope Using Experimental and Theoretical X-Ray Emission Yields
Mathias Procop, Vasile-Dan Hodoroaba, Ralf Terborg and Dirk Berger22 (6) 1360 (2016)https://doi.org/10.1017/S1431927616011788
Elemental characterisation of sub 20nm structures in devices using new SEM-EDS technology
J.T. Sagar, S.R. Burgess, C. McCarthy and X. Li64 367 (2016)https://doi.org/10.1016/j.microrel.2016.07.080
Directional solidification of the eutectic LiF–LiYF4 using Bridgman and micro-pulling down techniques: Microstructural study and some properties
María Fernanda Acosta, Steffen Ganschow, Detlef Klimm, et al. 34 (9) 2051 (2014)https://doi.org/10.1016/j.jeurceramsoc.2013.09.010
https://doi.org/10.1007/978-3-319-02081-5_2
New measurements of the surface ionization for quantitative electron probe microanalysis
C. Merlet and X. Llovet40 (1) 47 (2011)https://doi.org/10.1002/xrs.1294
Angle-resolved electron probe microanalysis revisited
J Cazaux44 (35) 355502 (2011)https://doi.org/10.1088/0022-3727/44/35/355502
An X-ray fluorescence depth distribution function for electron beam microanalysis
N. N. Mikheev, M. A. Stepovich and E. V. Shirokova74 (7) 1002 (2010)https://doi.org/10.3103/S1062873810070245
Grain Boundary Segregation in Metals
Pavel Lejček136 25 (2010)https://doi.org/10.1007/978-3-642-12505-8_3
Ultrasoft X-ray spectroscopy with variation of the electron excitation energy as a method for analyzing thin films and solid/solid interfaces
V. R. Galakhov and S. N. Shamin73 (7) 896 (2009)https://doi.org/10.3103/S1062873809070107
Measuring surface and grain boundary segregation using wavelength dispersive X-ray spectroscopy
F. Christien and R. Le Gall602 (14) 2463 (2008)https://doi.org/10.1016/j.susc.2008.05.017
On X-ray tube spectra, the dependence on the angular and electron energy of X-rays from the targets
A. A. Shaltout37 (3) 291 (2007)https://doi.org/10.1051/epjap:2007038
Electron beam excitation in thin layered samples
H.-J. Fitting, N. Cornet, Roushdey Salh, et al. 159 (1-3) 46 (2007)https://doi.org/10.1016/j.elspec.2007.03.014
Substrate effects correction in Auger electron spectrometry and electron probe microanalysis of thin films
H. Benhayoune, N. Dumelié and G. Balossier493 (1-2) 113 (2005)https://doi.org/10.1016/j.tsf.2005.07.305
Measuring the angular dependent energy distribution of backscattered electrons at variable geometry
J. Wagner, W. Stummer, M. Völkerer, A. Hanke and J. Wernisch27 (6) 298 (2005)https://doi.org/10.1002/sca.4950270605
Measurements of the surface ionization in multilayered specimens
C. Merlet, X. Llovet and F. Salvat33 (5) 376 (2004)https://doi.org/10.1002/xrs.757
Measurements of absolute X‐ray generation efficiency for selected K, L, and M‐lines
M. Satya Prasad and D. C. Joy25 (4) 210 (2003)https://doi.org/10.1002/sca.4950250408
Electron-probe X-ray microanalysis of individual particles of solid snow sediment with size factor correction
O.Yu. Belozerova, A.L. Finkelshtein and L.A. Pavlova34 (1) 49 (2003)https://doi.org/10.1016/S0968-4328(02)00056-2
Application of soft x‐ray emission spectroscopy for the study of solid‐phase reactions in Si‐based interfaces
V. R. Galakhov31 (3) 203 (2002)https://doi.org/10.1002/xrs.573
An experimental approach to the determination of the surface ionization φ(0) in electron probe microanalysis
G. F. Bastin, J. M. Dijkstra and H. J. M. Heijligers30 (4) 216 (2001)https://doi.org/10.1002/xrs.491
Surface potential measurements of electron-irradiated insulators using backscattered and secondary electron spectra from an electrostatic toroidal spectrometer adapted for scanning electron microscope applications
O. Jbara, M. Belhaj, S. Odof, et al. 72 (3) 1788 (2001)https://doi.org/10.1063/1.1344596
The application of depth distribution, ϕ(ρz) curves to quantitative electron probe microanalysis
James D. Brown14 (3) 475 (1999)https://doi.org/10.1039/A806754F
Monte-Carlo Simulation of Low Energy Electron Scattering in Solids
J.-Ch. Kuhr and H.-J. Fitting172 (2) 433 (1999)https://doi.org/10.1002/(SICI)1521-396X(199904)172:2<433::AID-PSSA433>3.0.CO;2-X
X-ray tube spectra
Horst Ebel28 (4) 255 (1999)https://doi.org/10.1002/(SICI)1097-4539(199907/08)28:4<255::AID-XRS347>3.0.CO;2-Y
Modern Developments and Applications in Microbeam Analysis
Xavier Llovet, Claude Merlet and Francesc Francesc Salvathttps://doi.org/10.1007/978-3-7091-7506-4_21
Modern Developments and Applications in Microbeam Analysis
Peter Karduckhttps://doi.org/10.1007/978-3-7091-7506-4_16
The efficiency of X‐ray production at low energies
Joy191 (1) 74 (1998)https://doi.org/10.1046/j.1365-2818.1998.00329.x
X-ray emission spectroscopic studies of silicon precipitation in surface layer of SiO2 induced by argon excimer laser irradiation
K Kurosawa, P.R Herman, E.Z Kurmaev, et al. 126 (1-2) 83 (1998)https://doi.org/10.1016/S0169-4332(97)00586-2
Scanning Electron Microscopy
Ludwig Reimer45 379 (1998)https://doi.org/10.1007/978-3-540-38967-5_10
Quantitative electron probe microanalysis of metallic oxide mixtures applying an empirical calibration technique
F. Bosch Reig, V. Peris Martinez, J.V. Gimeno Adelantado, et al. 52 (1) 67 (1997)https://doi.org/10.1016/S0584-8547(96)01566-2
EDX depths analysis of MIS-structures
Hans -Joachim Fitting, Jan -Christian Kuhr, Michael Goldberg, B�rbel Becher and Torsten Barfels125 (1-4) 235 (1997)https://doi.org/10.1007/BF01246189
Microbeam and Nanobeam Analysis
Evangelos Valamontes and Androula G. Nassiopouloshttps://doi.org/10.1007/978-3-7091-6555-3_56
Electron bremsstrahlung spectra on La near the 4d threshold
A V Korol, A G Lyalin, A S Shulakov and A V Solovy'ov29 (16) L611 (1996)https://doi.org/10.1088/0953-4075/29/16/004
Microbeam and Nanobeam Analysis
X. Llovet, A. Riveros and F. Salvathttps://doi.org/10.1007/978-3-7091-6555-3_33
A new analytical model for cathodoluminescence emission as a function of the beam energy in GaAs and InP materials
J.F. Bresse42 (1-3) 199 (1996)https://doi.org/10.1016/S0921-5107(96)01707-2
Microbeam and Nanobeam Analysis
Peter Klein, Michael Andrae, Kurt Röhrbacher and Johann Wernischhttps://doi.org/10.1007/978-3-7091-6555-3_29
Angular‐dependent energy distributions for backscattered electrons—Calculation of the surface ionization
M. Andrae, K. Rührbacher, P. Klein and J. W. Rnisch18 (6) 401 (1996)https://doi.org/10.1002/sca.1996.4950180602
X-Ray Spectrometry in Electron Beam Instruments
K. F. J. Heinrichhttps://doi.org/10.1007/978-1-4615-1825-9_1
Effects of the introduction of the discrete energy loss process into Monte Carlo simulation of electron scattering
Kenji Murata, Masaaki Yasuda and Hiroaki Kawata17 (4) 228 (1995)https://doi.org/10.1002/sca.4950170403
Monte Carlo calculation of X-ray depth profiles in Si substrate coated with films
Ding Ze-Jun and Wu Ziqin27 (2) 387 (1994)https://doi.org/10.1088/0022-3727/27/2/031
Quantitative EPMA of element depth distribution
Alexander Berner and Guy Proaktor114-115 (1) 195 (1994)https://doi.org/10.1007/BF01244543
Kinetic equation‐based calculation of the electron distribution in the target exposed to the electron beam
L. A. Bakaleinikov and E. A. Tropp23 (3) 125 (1994)https://doi.org/10.1002/xrs.1300230306
Practical interest of multicomponent standards for quantitative AES
M.‐Th. Perrot‐Simonetta, C. Lorenzon and M. Biscondi21 (5) 316 (1994)https://doi.org/10.1002/sia.740210509
New developments in theory of fast electron scattering in solids: Applications to microbeam analysis
I. S. Tilinin and W. S. M. Werner114-115 (1) 485 (1994)https://doi.org/10.1007/BF01244576
Correction procedures in electron probe microanalysis of bulk samples
Peter Duncumb114-115 (1) 3 (1994)https://doi.org/10.1007/BF01244530
Recent progress in electron probe microanalysis
A P Mackenzie56 (4) 557 (1993)https://doi.org/10.1088/0034-4885/56/4/002
Review of φ(ρz) curves in electron probe microanalysis
José Riveros and Gustavo Castellano22 (1) 3 (1993)https://doi.org/10.1002/xrs.1300220103
Microanalysis and on-line computers
Kurt F. J. Heinrich3 (2-3) 95 (1992)https://doi.org/10.1051/mmm:0199200302-309500
Accurate description of surface ionization in electron probe microanalysis: An improved formulation
Claude Merlet21 (5) 229 (1992)https://doi.org/10.1002/xrs.1300210507
Electron Microbeam Analysis
Claude Merlet12 107 (1992)https://doi.org/10.1007/978-3-7091-6679-6_8
Electron Microbeam Analysis
Hans-Jürgen August12 139 (1992)https://doi.org/10.1007/978-3-7091-6679-6_12
Absorption correction in electron probe microanalysis
M. Gaber21 (5) 215 (1992)https://doi.org/10.1002/xrs.1300210505
Electron Probe Quantitation
J. D. Brownhttps://doi.org/10.1007/978-1-4899-2617-3_5
Calculation of depth distribution functions for characteristic x‐radiation using an electron scattering model. I—theory
Hans‐Jürgen August and Johann Wernisch20 (3) 131 (1991)https://doi.org/10.1002/xrs.1300200306
Electron Probe Quantitation
Peter Karduck and Werner Rehbachhttps://doi.org/10.1007/978-1-4899-2617-3_11
Quantitative electron probe microanalysis for the characterization of thin carbon-boron layers in fusion devices
Peter Karduck, Norbert Ammann, Hans G�nter Esser and J�rg Winter341 (5-6) 315 (1991)https://doi.org/10.1007/BF00321926
Electron Probe Quantitation
Rod Packwoodhttps://doi.org/10.1007/978-1-4899-2617-3_6
Electron Probe Quantitation
Jean-Louis Pouchou and Françoise Pichoirhttps://doi.org/10.1007/978-1-4899-2617-3_4
Calculation of the depth distribution function for continuous radiation
H.‐J. August and J. Wernisch13 (3) 207 (1991)https://doi.org/10.1002/sca.4950130302
Surface film X‐ray microanalysis
J. L. Pouchou and F. Pichoir12 (4) 212 (1990)https://doi.org/10.1002/sca.4950120407
Optimization of K‐ratio measurements for electron probe microanalysis
D. Schalkoord, P. Karduck and W. P. Rehbach12 (4) 185 (1990)https://doi.org/10.1002/sca.4950120404
Calculation and comparison of the surface ionization ϕ(0)
H‐J. August and J. Wernisch12 (1) 14 (1990)https://doi.org/10.1002/sca.4950120104
X‐ray depth distribution function, ϕ(ρz), for thin spheres
Nuri A. Zreiba and Thomas F. Kelly19 (6) 275 (1990)https://doi.org/10.1002/xrs.1300190605
The prospects of a universal correction procedure for quantitative EPMA
V. D. Scott and G. Love12 (4) 193 (1990)https://doi.org/10.1002/sca.4950120405
Mean depth of X‐ray production by electron beams in thick targets
M. Gaber and A. A. Abou El‐Khier19 (4) 197 (1990)https://doi.org/10.1002/xrs.1300190409
ϕ(ρz)-Determination for Advanced Applications of Electron Probe Microanalysis
Peter Karduck and Norbert Ammann48 (2) 14 (1990)https://doi.org/10.1017/S0424820100133667
Spectral distribution of backseattered electrons: Application to electron probe microanalysis
M. Del Giorgio, J. Trincavelli and J. A. Riveros19 (6) 261 (1990)https://doi.org/10.1002/xrs.1300190603
Monte carlo calculations of the X‐ray induced enhancement signal in electron probe microanalysis (EPMA) and Auger electron spectroscopy (AES) of stratified materials
A. G. Nassiopoulos and E. Valamontes15 (7) 405 (1990)https://doi.org/10.1002/sia.740150703
Measurement and parameterization of ϕ(ρz) curves for quantitative electron probe microanalysis
J. D. Brown48 (2) 190 (1990)https://doi.org/10.1017/S0424820100134545
Recent advances in electron-probe x-ray microanalysis
W.A. Van Borm and F.C. Adams218 185 (1989)https://doi.org/10.1016/S0003-2670(00)80299-8
Absorption and fluorescence corrections of characteristic x‐rays from thin spheres
Nuri A. Zreiba and Thomas F. Kelly17 (6) 229 (1988)https://doi.org/10.1002/xrs.1300170607
Thin film analysis by x‐ray microanalysis using gaussian Φ (ρ z) curves
H.‐J. Hunger10 (2) 65 (1988)https://doi.org/10.1002/sca.4950100203
Progress in quantitative X‐ray microanalysis of frozen‐hydrated bulk biological samples
A. T. Marshall9 (1) 57 (1988)https://doi.org/10.1002/jemt.1060090106
Experimental and theoretical X-Ray distribution function, δ(ρz), for microanalysis of thin
N. A. Zreiba, C. A. Pico and T. F. Kelly46 508 (1988)https://doi.org/10.1017/S0424820100104601
Influence de l'état de surface sur les calculs de correction en microanalyse x
A. Toumi and C. Landron100 (2) 535 (1987)https://doi.org/10.1002/pssa.2211000219
Collection of electron-beam-generated carriers in the presence of a grain boundary or an epitaxial interface
O. Paz and J. M. Borrego61 (4) 1537 (1987)https://doi.org/10.1063/1.338087
Theoretical assessment of the coefficients φ(0) and γ0 of the Gaussian φ(ρz) curves
J. H. Tirira Saa and J. A. Riveros16 (1) 27 (1987)https://doi.org/10.1002/xrs.1300160107
Methods for quantitative electron probe microanalysis of small particles and thin films
J.D. Brown and R.H. Packwood26 (3) 294 (1986)https://doi.org/10.1016/0169-4332(86)90070-X
Electron microprobe analysis: The upper limit of submicron spectroscopy
Paul F. Hlava and William F. Chambers44 744 (1986)https://doi.org/10.1017/S0424820100145091
Some considerations on the electric field induced in insulators by electron bombardment
Jacques Cazaux59 (5) 1418 (1986)https://doi.org/10.1063/1.336493
A Further Improvement in the Gaussian ϕ(ϱ) Approach for Matrix Correction in Quantitative Electron Probe Microanalysis
G. F. Bastin, H. J. M. Heijligers and F. J. J. van Loo8 (2) 45 (1986)https://doi.org/10.1002/sca.4950080204
Scanning Electron Microscopy
Ludwig Reimer45 365 (1985)https://doi.org/10.1007/978-3-662-13562-4_9
Progress in Materials Analysis
P. Karduck and W. Rehbachhttps://doi.org/10.1007/978-3-7091-8840-8_20
Universal correction procedure for electron-probe microanalysis. I. Measurement of X-ray depth distributions in solids
D A Sewell, G Love and V D Scott18 (7) 1233 (1985)https://doi.org/10.1088/0022-3727/18/7/010
Quantitative electron microprobe analysis without standard samples
Johann Wernisch14 (3) 109 (1985)https://doi.org/10.1002/xrs.1300140304
Quantitative electron probe microanalysis of oxygen in titanomagnetites with implications for oxidation processes
Toshio Furuta, Masayuki Otsuki and Takatoshi Akimoto90 (B4) 3145 (1985)https://doi.org/10.1029/JB090iB04p03145
Universal correction procedure for electron-probe microanalysis. II. The absorption correction
D A Sewell, G Love and V D Scott18 (7) 1245 (1985)https://doi.org/10.1088/0022-3727/18/7/011
Electron Beam Analysis of Materials
M. H. Lorettohttps://doi.org/10.1007/978-94-009-5540-0_6
Evaluation of the use of Gaussian ϕ(ρz) curves in quantitative electron probe microanalysis: A new optimization
G. F. Bastin, F. J. J. Van Loo and H. J. M. Heijligers13 (2) 91 (1984)https://doi.org/10.1002/xrs.1300130211
Progress in Materials Analysis
P. Karduck, H. J. Schürhoff and W.-G. Burchard10 231 (1983)https://doi.org/10.1007/978-3-7091-3943-1_19
A New Theory for Microprobe Analysis
R. H. Packwood and J. D. Brown22 (2) 211 (1983)https://doi.org/10.1179/cmq.1983.22.2.211
On the evaluation of absorption data from soft X-ray self-absorption measurements
R S Crisp13 (6) 1325 (1983)https://doi.org/10.1088/0305-4608/13/6/030
Pages :
1 à 100 sur 235 articles
