Numéro |
J. Phys. Radium
Volume 17, Numéro 3, mars 1956
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Page(s) | 194 - 200 | |
DOI | https://doi.org/10.1051/jphysrad:01956001703019400 |
J. Phys. Radium 17, 194-200 (1956)
DOI: 10.1051/jphysrad:01956001703019400
Laboratoire de Physique, Faculté des Sciences, Alger
6855 - Thin film structure and morphology.
Key words
electrical conductivity -- films -- granular structure -- optical constants
DOI: 10.1051/jphysrad:01956001703019400
Influence des variations de structure sur certaines propriétés électriques et optiques des lames minces étudiées sous vide
M. Perrot et J.P. DavidLaboratoire de Physique, Faculté des Sciences, Alger
Abstract
The objet of this work is an experimental study of some optical and electrical properties of thin layers with granular structure as functions of their thickness, all measurements being carried simultanously in vacuo. Authors have tried to connect the variations of these properties to the variations of structure of theses layers by aging or by action of the electrical field applied. An interpretation is given to explain the important variation of the optical constants in regard of the value for bulk metal.
6855 - Thin film structure and morphology.
Key words
electrical conductivity -- films -- granular structure -- optical constants