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https://doi.org/10.1140/epjst/e2020-900220-3

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EPJ Photovoltaics 10 2 (2019)
https://doi.org/10.1051/epjpv/2019004

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https://doi.org/10.1364/OL.44.004539

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https://doi.org/10.1002/sia.6473

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Liquid Crystals 1 (2015)
https://doi.org/10.1080/02678292.2014.986769

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https://doi.org/10.1364/AO.54.006208

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https://doi.org/10.1021/la501275h

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Nanoscale 6 (21) 13022 (2014)
https://doi.org/10.1039/C4NR03557G

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https://doi.org/10.1364/AO.53.007454

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https://doi.org/10.1063/1.4891188

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Solar Energy Materials and Solar Cells 125 310 (2014)
https://doi.org/10.1016/j.solmat.2013.12.026

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Optics Communications 286 357 (2013)
https://doi.org/10.1016/j.optcom.2012.09.020

Effects of the multiple internal reflection and sample thickness changes on determination of electro-optic coefficient values of a polymer film

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Lithuanian Journal of Physics 52 (1) 30 (2012)
https://doi.org/10.3952/lithjphys.52103

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Lithuanian Journal of Physics 52 (1) 30 (2012)
https://doi.org/10.3952/physics.v52i1.2264

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Journal of the Optical Society of America A 23 (12) 3223 (2006)
https://doi.org/10.1364/JOSAA.23.003223

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Journal of the Optical Society of America A 19 (8) 1712 (2002)
https://doi.org/10.1364/JOSAA.19.001712

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MRS Proceedings 426 (1996)
https://doi.org/10.1557/PROC-426-587

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Applied Optics 30 (22) 3176 (1991)
https://doi.org/10.1364/AO.30.003176

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Journal of Lightwave Technology 7 (10) 1601 (1989)
https://doi.org/10.1109/50.39104

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Applied Optics 28 (7) 1382 (1989)
https://doi.org/10.1364/AO.28.001382

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Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 19-20 943 (1987)
https://doi.org/10.1016/S0168-583X(87)80190-8

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Applied Optics 20 (19) 3274 (1981)
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Applied Physics 22 (2) 193 (1980)
https://doi.org/10.1007/BF00886005

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Optica Acta: International Journal of Optics 27 (8) 1267 (1980)
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Journal of Optics 8 (3) 201 (1977)
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Thin Solid Films 27 (1) 83 (1975)
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Review of Scientific Instruments 46 (1) 48 (1975)
https://doi.org/10.1063/1.1134050

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