Numéro
J. Phys. Radium
Volume 11, Numéro 7, juillet 1950
Page(s) 310 - 314
DOI https://doi.org/10.1051/jphysrad:01950001107031000
J. Phys. Radium 11, 310-314 (1950)
DOI: 10.1051/jphysrad:01950001107031000

La détermination de l'indice et de l'épaisseur des couches minces transparentes

F. Abelès


Abstract
Spectrophotometric methods : normal and oblique incidence. New rapid method for the measurement of the refractive indices. Results obtained on thin films of various materials. Polarimetric methods; formula allowing a rapid calculation for films of optical thickness greater than λ/4.

PACS
0760H - Refractometers and reflectometers.
0760 - Optical instruments and equipment.

Key words
aluminium compounds -- calcium compounds -- lithium compounds -- magnesium compounds -- optical films -- polarimeters -- refractive index measurement -- spectrophotometry -- thickness measurement -- titanium compounds