| Numéro |
J. Phys. Radium
Volume 11, Numéro 7, juillet 1950
|
|
|---|---|---|
| Page(s) | 310 - 314 | |
| DOI | https://doi.org/10.1051/jphysrad:01950001107031000 | |
J. Phys. Radium 11, 310-314 (1950)
DOI: 10.1051/jphysrad:01950001107031000
0760H - Refractometers and reflectometers.
0760 - Optical instruments and equipment.
Key words
aluminium compounds -- calcium compounds -- lithium compounds -- magnesium compounds -- optical films -- polarimeters -- refractive index measurement -- spectrophotometry -- thickness measurement -- titanium compounds
DOI: 10.1051/jphysrad:01950001107031000
La détermination de l'indice et de l'épaisseur des couches minces transparentes
F. Abelès Abstract
Spectrophotometric methods : normal and oblique incidence. New rapid method for the measurement of the refractive indices. Results obtained on thin films of various materials. Polarimetric methods; formula allowing a rapid calculation for films of optical thickness greater than λ/4.
0760H - Refractometers and reflectometers.
0760 - Optical instruments and equipment.
Key words
aluminium compounds -- calcium compounds -- lithium compounds -- magnesium compounds -- optical films -- polarimeters -- refractive index measurement -- spectrophotometry -- thickness measurement -- titanium compounds