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This article has been cited by the following article(s):

Some Aspects of Simultaneous Evaporation Techniques

D.N.W. Chinnery
Optica Acta: International Journal of Optics 32 (5) 557 (1985)
DOI: 10.1080/713821759
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A Fairweather, F F Roberts and A J E Welch
Reports on Progress in Physics 15 (1) 142 (1952)
DOI: 10.1088/0034-4885/15/1/306
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Characterization of inhomogeneous dielectric films by spectroscopic ellipsometry

J. Rivory
Thin Solid Films 313-314 333 (1998)
DOI: 10.1016/S0040-6090(97)00842-0
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Conditions for Zero Reflectance of Thin Dielectric Films on Laser Materials*

Vern N. Smiley
Journal of the Optical Society of America 58 (11) 1469 (1968)
DOI: 10.1364/JOSA.58.001469
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Homogeneously mixed dielectric films as double-layer antireflection coatings

R. Hradaynath, K. N. Chopra and O. P. Grover
Applied Optics 18 (3) 328 (1979)
DOI: 10.1364/AO.18.000328
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Optical Properties of a Class of Inhomogeneous Thin Films

Roland Jacobsson
Optica Acta: International Journal of Optics 10 (4) 309 (1963)
DOI: 10.1080/713817826
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Antireflection coatings effective at two wavelengths simultaneously in the visible region using homogeneously mixed dielectrics

K. N. Chopra, O. P. Grover and R. Hradaynath
Applied Optics 18 (11) 1750 (1979)
DOI: 10.1364/AO.18.001750
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Optical dispersion of homogeneously mixed ZnSMgF2 films

V.N. Yadava, Shiv K. Sharma and K.L. Chopra
Thin Solid Films 22 (1) 57 (1974)
DOI: 10.1016/0040-6090(74)90279-X
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Determination of a cation distribution model of the spinel system Fe3−xAlxO4

G. Dehe, B. Seidel, K. Melzer and C. Michalk
Physica Status Solidi (a) 31 (2) 439 (1975)
DOI: 10.1002/pssa.2210310212
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