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Cited article:
J. Vincent
J. Phys. Radium, 13 2 (1952) 59-67
This article has been cited by the following article(s):
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Simple Duochromator for the Measurement of Small Displacements of a Spectral Line
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Sources of error in the modulated wavelength optical thickness monitor for dielectric layers
P H Lissberger
Journal of Physics E: Scientific Instruments 2 (10) 875 (1969)
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H. A. Macleod
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Interference filters for the infra-red
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Observations des émulsions nucléaires en lumière réfléchie
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Influence du Procédé de Contrôle Sur Les Tolérances de Réalisation des Filtres Interférentiels à Bande Etroite
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Progress in Optics
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Detection limits and sensibility of visual interferometers
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Spectrophotometry by Means of the Fabry-Perot Interferometer
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Two-Color Monitoring Method for Reproducing Thin Film Thicknesses
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Optical applications of dielectric thin films
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Ergebnisse der Chirurgie und Orthopädie
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Mesure simultanée des facteurs de réflexion et de transmission des couches minces, et des changements de phase correspondants
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