EDP Sciences logo
Subscriber Authentication Point
Search
Menu

Articles citing this article

The Citing articles tool gives a list of articles citing the current article.
The citing articles come from EDP Sciences database, as well as other publishers participating in CrossRef Cited-by Linking Program. You can set up your personal account to receive an email alert each time this article is cited by a new article (see the menu on the right-hand side of the abstract page).

Cited article:

This article has been cited by the following article(s):

Progress in the production of optical multilayer films

P.B. Clapham
Thin Solid Films 4 (4) 291 (1969)
DOI: 10.1016/0040-6090(69)90074-1
See this article

Dielectric properties of evaporated films

C. Weaver
Advances in Physics 11 (42) 83 (1962)
DOI: 10.1080/00018736200101272
See this article

Apparatus for the controlled deposition of optical film systems

W. Steckelmacher, J.M. Parisot, L. Holland and T. Putner
Vacuum 9 (3-4) 171 (1959)
DOI: 10.1016/0042-207X(59)90189-7
See this article

Simple Duochromator for the Measurement of Small Displacements of a Spectral Line

Joseph G. Hirschberg
Applied Optics 4 (2) 243 (1965)
DOI: 10.1364/AO.4.000243
See this article

A High-precision Adaptation of the 'Turning-point' Method of Monitoring the Optical Thickness of Dielectric Layers Using Microprocessors

D.R. Gibson, P.H. Lissberger, I. Salter and D.G. Sparks
Optica Acta: International Journal of Optics 29 (2) 221 (1982)
DOI: 10.1080/713820821
See this article

Sources of error in the modulated wavelength optical thickness monitor for dielectric layers

P H Lissberger
Journal of Physics E: Scientific Instruments 2 (10) 875 (1969)
DOI: 10.1088/0022-3735/2/10/310
See this article

Monitoring of optical coatings

H. A. Macleod
Applied Optics 20 (1) 82 (1981)
DOI: 10.1364/AO.20.000082
See this article

Thin film narrow band optical filters

H.A. Macleod
Thin Solid Films 34 (2) 335 (1976)
DOI: 10.1016/0040-6090(76)90482-X
See this article

Interference filters for the infra-red

O.S. Heavens, J. Ring and S.D. Smith
Spectrochimica Acta 10 (2) 179 (1957)
DOI: 10.1016/0371-1951(57)80185-4
See this article

Observations des émulsions nucléaires en lumière réfléchie

R. Rechenmann
Il Nuovo Cimento 2 (5) 1104 (1955)
DOI: 10.1007/BF02855854
See this article

Influence du Procédé de Contrôle Sur Les Tolérances de Réalisation des Filtres Interférentiels à Bande Etroite

E. Pelletier, R. Kowalczyk and A. Fornier
Optica Acta: International Journal of Optics 20 (7) 509 (1973)
DOI: 10.1080/713818800
See this article

Accurate monitoring of dielectric film thickness

OS Heavens, GJ Kopek and Yuan Yi-Fang
Vacuum 46 (2) 199 (1995)
DOI: 10.1016/0042-207X(94)E0040-6
See this article

Progress in Optics

P. Rouard and P. Bousquet
Progress in Optics 4 145 (1965)
DOI: 10.1016/S0079-6638(08)70491-8
See this article

A microprocessor-controlled magnetron system for sputtering optical films

P.J. Chandler, P.R. Meek and L. Holland
Thin Solid Films 86 (2-3) 183 (1981)
DOI: 10.1016/0040-6090(81)90287-X
See this article

Detection limits and sensibility of visual interferometers

H Dupoisot and P Lostis
Nouvelle Revue d'Optique 4 (6) 373 (1973)
DOI: 10.1088/0335-7368/4/6/309
See this article

Sur la localisation du bord de plage

Gérard Roblin
Nouvelle Revue d'Optique Appliquée 1 (3) 155 (1970)
DOI: 10.1088/0029-4780/1/3/304
See this article

Refractive indices of zinc sulfide and cryolite in multilayer stacks

R. P. Netterfield
Applied Optics 15 (8) 1969 (1976)
DOI: 10.1364/AO.15.001969
See this article

Fortschritte in Leistungsf�higkeit und Anwendungsm�glichkeit des Fabry-Perot-Interferometers

Andreas Steudel
Die Naturwissenschaften 44 (8) 249 (1957)
DOI: 10.1007/BF00621089
See this article

Spectrophotometry by Means of the Fabry-Perot Interferometer

P. Jacquinot and R. Chabbal
Journal of the Optical Society of America 46 (7) 556_1 (1956)
DOI: 10.1364/JOSA.46.0556_1
See this article

Two-Color Monitoring Method for Reproducing Thin Film Thicknesses

Alan C. Traub
Journal of the Optical Society of America 46 (11) 999_1 (1956)
DOI: 10.1364/JOSA.46.0999_1
See this article

Optical applications of dielectric thin films

P H Lissberger
Reports on Progress in Physics 33 (1) 197 (1970)
DOI: 10.1088/0034-4885/33/1/305
See this article

Fortschritte Der Chemischen Forschung Volume 2

R. Suhrmann and H. Luther
Fortschritte der Chemischen Forschung, Fortschritte Der Chemischen Forschung Volume 2 2/4 758 (1953)
DOI: 10.1007/BFb0051791
See this article

Thin films in Fabry-Perot interferometry

E Pelletier
Journal of Optics 17 (1) 43 (1986)
DOI: 10.1088/0150-536X/17/1/004
See this article

Contr le et r alisation de rev tements multidi lectriques pr sentant des caract ristiques spectrales impos es

E Pelletier and P Giacomo
Nouvelle Revue d'Optique Appliquée 3 (3) 133 (1972)
DOI: 10.1088/0029-4780/3/3/304
See this article

Constantes optiques et structure des couches minces

P. Bousquet and P. Rouard
Journal de Physique et le Radium 21 (12) 873 (1960)
DOI: 10.1051/jphysrad:019600021012087300
See this article

Préparation et propriétés de couches réfléchissantes pour le Fabry-Perot dans l'ultra-violet

A. Steudel
Journal de Physique et le Radium 19 (3) 312 (1958)
DOI: 10.1051/jphysrad:01958001903031200
See this article

Remarque sur l'influence de la dispersion dans les systèmes de couches minces diélectriques

F. Abflès
Journal de Physique et le Radium 19 (3) 327 (1958)
DOI: 10.1051/jphysrad:01958001903032700
See this article

Séchage des émulsions photographiques nucléaires par gradient de température

Roger Rechenmann
Journal de Physique et le Radium 17 (2) 163 (1956)
DOI: 10.1051/jphysrad:01956001702016301
See this article

Ergebnisse der Chirurgie und Orthopädie

W. Wenz
Ergebnisse der Chirurgie und Orthopädie 81 (1964)
DOI: 10.1007/978-3-642-94884-8_3
See this article

Mesure simultanée des facteurs de réflexion et de transmission des couches minces, et des changements de phase correspondants

P. Bousquet, R. Deleuil and A. Gastaud
Journal de Physique 25 (1-2) 31 (1964)
DOI: 10.1051/jphys:01964002501-203101
See this article