J. Phys. Radium
Volume 17, Numéro 3, mars 1956
Page(s) 283 - 286
J. Phys. Radium 17, 283-286 (1956)
DOI: 10.1051/jphysrad:01956001703028300

Contribution à l'étude des propriétés thermoélectriques des lames minces d'aluminium

J. Savornin et F. Savornin

The thermoelectric properties of thin Aluminium films evaporated on glass bases have been studied. The junctions of two Constantan-Copper thermocouples are fastened on both ends of the layer ; a potentiometer indicates the e.m.f. of the Aluminium/Copper thermocouple. The samples thicker than 100 millimicrons show about the same thermoelectric power as the massive metal itself. A non important "thermal evolution "appears sometimes. The thermoelectric Voltage of films, the thickness of which is comprised between 10 and 100 millimicrons, rises suddenly up to 0,1 V, for temperatures increasing with the thickness of the sample. A similar rise is observed when the thin film is connected to silver wires.

6855 - Thin film structure and morphology.

Key words
aluminium -- films -- thermoelectricity