Optical properties of thin platesLes propriétés optiques des lames minces p. 305 P. Rouard DOI: https://doi.org/10.1051/jphysrad:01950001107030500 AbstractPDF (246.7 KB)
The generalized theory of thin films.La théorie générale des couches minces p. 307 Florin Abelès DOI: https://doi.org/10.1051/jphysrad:01950001107030700 AbstractPDF (584.0 KB)References
The determination of the index [refractive] and of the thickness of thin transparent films.La détermination de l'indice et de l'épaisseur des couches minces transparentes p. 310 F. Abelès DOI: https://doi.org/10.1051/jphysrad:01950001107031000 AbstractPDF (869.5 KB)References
The optical admittance of homogeneous and heterogeneous films.L'admittance optique des couches homogènes et hétérogènes p. 315 B.S. Blaisse DOI: https://doi.org/10.1051/jphysrad:01950001107031500 AbstractPDF (1.021 MB)References
Graphical study of the theoretical optical properties of thin films.Étude graphique des propriétés optiques théoriques des lames minces p. 321 P. Cotton DOI: https://doi.org/10.1051/jphysrad:01950001107032100 AbstractPDF (777.3 KB)References
Application to thin films of the theory of the reflection interference etalon.Application aux couches minces de la théorie de l'étalon interférentiel par réflexion p. 327 Ch. Dufour DOI: https://doi.org/10.1051/jphysrad:01950001107032700 AbstractPDF (724.2 KB)
Graphical study of the optical properties of thin metallic films.Étude graphique des propriétés optiques des lames métalliques minces p. 332 D. Malé DOI: https://doi.org/10.1051/jphysrad:01950001107033200 AbstractPDF (1.330 MB)References
Transmission and reflection theory in systems of multiple thin films.Théorie de la transmission et de la réflexion dans les systèmes de couches minces multiples p. 337 F. Scandone DOI: https://doi.org/10.1051/jphysrad:01950001107033700 AbstractPDF (623.2 KB)References
The reflection of light on glass supporting multiple thin films.Sur la réflexion de la lumière sur des verres supportant des couches minces multiples p. 342 Antonin Vasicek DOI: https://doi.org/10.1051/jphysrad:01950001107034200 AbstractPDF (489.2 KB)References
Polarimetric method of studying the heterogeneity of a thin film supported on glass.Méthode polarimétrique pour l'étude de l'hétérogénéité d'une couche mince sur support de verre p. 346 Antonin Vasicek DOI: https://doi.org/10.1051/jphysrad:01950001107034600 AbstractPDF (462.6 KB)References
Cathodic sputtering apparatus for the production of deposits whose density is controlled during formation.Un appareil de pulvérisation cathodique permettant d'obtenir des couches dont la densité est contrôlée pendant la formation p. 351 A. Andant DOI: https://doi.org/10.1051/jphysrad:01950001107035100 AbstractPDF (256.6 KB)
Apparatus for the preparation by vacuum evaporation of variable-colour interference filters.Mécanisme pour la préparation par évaporation dans le vide de filtres interférentiels à couleur variable p. 353 Ch. Dufour DOI: https://doi.org/10.1051/jphysrad:01950001107035300 AbstractPDF (403.8 KB)References
Some factors influencing the adhesion of films produced by vacuum evaporation p. 355 O.S. Heavens DOI: https://doi.org/10.1051/jphysrad:01950001107035500 AbstractPDF (1.241 MB)
Preparation of thin films whose thickness varies in one direction, according to some given law.Préparation de lames minces dont l'épaisseur varie, dans une direction, suivant une loi donnée quelconque p. 361 Pierre Jacquinot DOI: https://doi.org/10.1051/jphysrad:01950001107036100 AbstractPDF (382.9 KB)References
Vacuum evaporation apparatus for the metallization of interferometer films.Appareil de vaporisation dans le vide pour la métallisation de lames d'interféromètre p. 363 J. Roig and Descamps DOI: https://doi.org/10.1051/jphysrad:01950001107036300 AbstractPDF (534.1 KB)
Polarimetric method of thin film study by variation of the refractive index in the region of incidence (immersion).Méthode polarimétrique d'étude des couches minces par variation de l'indice du milieu d'incidence (immersion) p. 366 F. Suhner DOI: https://doi.org/10.1051/jphysrad:01950001107036600 AbstractPDF (1.295 MB)
Interferometric evaluation of thicknesses of thin films p. 373 S. Tolansky DOI: https://doi.org/10.1051/jphysrad:01950001107037300 AbstractPDF (339.2 KB)
Optical properties of thin silicon films.Propriétés optiques des lames minces de silicium p. 375 P. Cotton DOI: https://doi.org/10.1051/jphysrad:01950001107037500 AbstractPDF (810.8 KB)References
The protection of optical glass and aluminium-surfaced mirrors.Protection des verres d'optique et miroirs aluminiés p. 380 Flamant DOI: https://doi.org/10.1051/jphysrad:01950001107038000 AbstractPDF (1.000 MB)
Evolution of certain optical properties of very thin metallic films.Évolution de certaines propriétés optiques des lames métalliques très minces p. 385 M. Perrot DOI: https://doi.org/10.1051/jphysrad:01950001107038500 AbstractPDF (1001 KB)References
The optical properties of thin platinum films and their comparison with those of other metals.Sur les propriétés optiques des lames minces de platine et leur comparaison avec celles d'autres métaux p. 390 P. Rouard DOI: https://doi.org/10.1051/jphysrad:01950001107039000 AbstractPDF (704.2 KB)References
On the structure and properties of some metal and metal oxide films p. 394 Georg Hass and Noel W. Scott DOI: https://doi.org/10.1051/jphysrad:01950001107039400 AbstractPDF (1.857 MB)References
Polarimetric applications of thin films.Les applications des couches minces en polarimétrie p. 403 F. Abelès DOI: https://doi.org/10.1051/jphysrad:01950001107040300 AbstractPDF (529.9 KB)References
Thin films in the infrared.Les couches minces dans l'infrarouge p. 407 Bruce H. Billings DOI: https://doi.org/10.1051/jphysrad:01950001107040700 AbstractPDF (1.022 MB)References
Theoretical study of five-fold films of the type Ag-F2Mg-Ag-F2Mg-Ag.Étude théorique de couches quintuples du type Ag—F 2Mg—Ag—F2Mg—Ag p. 413 Ch. Dufour DOI: https://doi.org/10.1051/jphysrad:01950001107041300 AbstractPDF (693.1 KB)References
The construction of interference filters for the transmission of specified wavelengths p. 418 K.M. Greenland and C. Billington DOI: https://doi.org/10.1051/jphysrad:01950001107041800 AbstractPDF (662.7 KB)References
The reflectivity of thin silver films and the performance of the Fabry-Perot interferometer p. 422 H. Kuhn DOI: https://doi.org/10.1051/jphysrad:01950001107042200 AbstractPDF (499.1 KB)References
The use of two Fabry-Perot interferometers in series for the detection of Faint satellites p. 425 H. Kuhn DOI: https://doi.org/10.1051/jphysrad:01950001107042500 AbstractPDF (289.5 KB)References
Use in interferometry of combinations of thin films.Utilisation des combinaisons de lames minces en interférométrie p. 427 Pierre Jacquinot and Charles Dufour DOI: https://doi.org/10.1051/jphysrad:01950001107042700 AbstractPDF (905.9 KB)References
Some further applications of multiple. Beam interferometry I. interferometric method for measuring differential polarisation phase change at metallic reflection p. 432 S. Tolansky DOI: https://doi.org/10.1051/jphysrad:01950001107043200 AbstractPDF (507.3 KB)
II. New multiple-beam localised fringes formed by strongly curved silvered thin plates p. 434 S. Tolansky DOI: https://doi.org/10.1051/jphysrad:01950001107043400 AbstractPDF (333.6 KB)
III. A further application of localized white-light fringes of superposition p. 436 S. Tolansky DOI: https://doi.org/10.1051/jphysrad:01950001107043600 AbstractPDF (626.9 KB)
IV. The oscillations of quartz crystals as revealed by multiple-beam interferometry p. 438 S. Tolansky DOI: https://doi.org/10.1051/jphysrad:01950001107043800 AbstractPDF (558.0 KB)
Practical applications of high and low-reflecting films on glass p. 441 John Strong DOI: https://doi.org/10.1051/jphysrad:01950001107044100 AbstractPDF (1.222 MB)References
Some current developments in multilayer optical films p. 444 A.F. Turner DOI: https://doi.org/10.1051/jphysrad:01950001107044400 AbstractPDF (2.398 MB)References
Optical properties of thins solid films [survey of bibliography].Propriétés optiques des lames minces solides p. 461 P. Cotton and P. Rouard DOI: https://doi.org/10.1051/jphysrad:01950001107046100 AbstractPDF (3.697 MB)References
