J. Phys. Radium
Volume 11, Numéro 7, juillet 1950
Page(s) 427 - 431
J. Phys. Radium 11, 427-431 (1950)
DOI: 10.1051/jphysrad:01950001107042700

Utilisation des combinaisons de lames minces en interférométrie

Pierre Jacquinot et Charles Dufour

The properties of all interference systems using multiple reflections between partially reflecting films are connected with the reflectivity and absorption of the latter. The important improvements are pointed out which one can obtain by using multiple films of dielectric substances (range of reflectivities below 0.90) or combinations of metallic and dielectric thin films (range of relectivities over 0.90). Analysis of the main results obtained.

0760L - Interferometers.
4279W - Optical coatings.
4225G - Edge and boundary effects; reflection and refraction.

Key words
light interferometry -- optical films -- light reflection